Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Fast Closed-loop System of Error Amplifier for Field Effect Transistors

A technology of error amplifier and field effect tube, which is applied in the direction of amplifiers, amplifier parts, negative feedback circuit layout, etc., can solve the problems of large gate voltage overshoot, control failure, and influence on control closed-loop speed, so as to reduce output Rate of change, guaranteed real-time tracking, easy-to-achieve effects

Active Publication Date: 2021-05-14
SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the large magnification of the error amplifier, the output rises rapidly under the input error Δr, resulting in a large overshoot of the gate voltage at the closed-loop operating point, which affects the control closed-loop speed, and even causes control failure.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Fast Closed-loop System of Error Amplifier for Field Effect Transistors
  • A Fast Closed-loop System of Error Amplifier for Field Effect Transistors
  • A Fast Closed-loop System of Error Amplifier for Field Effect Transistors

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0022] figure 2 The circuit diagram of the control system provided for the embodiment of the present invention, such as figure 2 As shown, the application circuit is composed of a DC power supply Vdc, a load capacitor C and a field effect transistor Q1, and the controlled electrical quantity is the charging current i from the DC power supply Vdc to the load capacitor C. Resistors R3, R4 and operational amplifier U form an error amplifier. The Zener diode D is pulled up to 12V through the current limiting resistor R2, and the generated reference control voltage is input to the positive input terminal of the operational amplifier U. The feedback amount of the charging current i is input to the negative input terminal of U through R3. The output of U is connected to Q1 to control its gate voltage. Resistor R1, capacitors C1, C2 and transistor Q2 constitute a power supply slow start circuit, and supply power to U for slow start through the emitter of Q2.

[0023] image 3 F...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fast closed-loop system for an error amplifier for field effect transistors, which includes an application circuit, a field effect transistor and an error amplifier. The feedback input end of the error amplifier is correspondingly connected to the application circuit, and the output end is correspondingly connected to the field The gate of the effect transistor; the field effect transistor is correspondingly connected to the application circuit; the power supply terminal of the error amplifier is correspondingly connected to the slow start circuit. The power supply end of the error amplifier is correspondingly connected to the slow start circuit, which can effectively reduce the output change rate of the error amplifier during the start-up phase, and ensure that the gate of the FET can quickly close the loop when it reaches the operating point; after the error amplifier power supply is stable, the control loop bandwidth is not affected. It can ensure the real-time tracking of the feedback voltage to the reference control voltage.

Description

technical field [0001] The invention relates to the technical field of electrical control, in particular to a fast closed-loop system of an error amplifier of a field effect tube. Background technique [0002] The control to output of the field effect tube has strong nonlinear characteristics, and only the narrow range in the middle is approximately linear. When using the linear range of the field effect tube for electrical control, the common choice is to form a negative feedback circuit based on the error amplifier. Closed-loop control is realized by adjusting the gate voltage of the FET. In order to shorten the closed-loop time from start to steady state of the error amplifier, the prior art adopts a method of adjusting the input control reference from zero. [0003] When using the prior art to start, as the input control reference is adjusted from zero, the output of the error amplifier also drives the gate voltage of the field effect transistor to increase from zero. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03F1/34
CPCH03F1/342
Inventor 余俊宏卓沛陈根余王凤岩
Owner SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products