Scanning electrochemical microscope sample stage for testing multi-standard sample strip electrolytic cell

Abstract

The invention relates to a scanning electrochemical microscope sample stage for testing a multi-standard sample strip electrolytic cell. The sample stage is formed by a Teflon carrier plate (the electrolytic cell at the upper end) and a U-shaped support. The left end wall and the right end wall of the electrolytic cell are respectively provided with a round hole for placing a counter electrode anda reference electrode respectively. The U-shaped support is fixed by screws with the carrier plate. Cylindrical small rods are riveted into the carrier plate in the positive direction and the negative direction of the X-axis and the positive direction of the Y-axis. The bottom surface is provided with a circular groove, the carrier plate at the center of the electrolytic cell is provided with a circular hole and the circular groove, a rubber gasket is placed in the groove, a test sample is placed on the rubber gasket, and then a metal pressing piece is placed. Bolts on the U-shaped support are adopted for fixation, and a probe is used for scanning the sample at the circular hole. The sample stage is simple and quick in sample preparation, convenient to remove and capable of testing multi-standard samples under the premise that the sample integrity is maintained. The tested sample can be reused for other test analysis, the application field of the SECM is expanded, and the utilizationrate is improved.

Description

technical field [0001] The invention relates to a scanning electrochemical microscope sample stage for testing multi-standard samples with electrolytic cells. Background technique [0002] Scanning Electrochemical Microscopy (SECM) works on the basis of electrochemical principles, and can measure the electrochemical current given by the oxidation or reduction of substances in the micro-area. It was based on ultra-microelectrodes (UME) and initial scanning tunnels by A.J. Bard's group in the late 1980s. A new electrochemical on-site detection technology with a resolution between ordinary optical microscopes and STMs is produced by the development of optical microscopy (STM). When the electrode (probe) scans close to the sample, the sample can be a conductor, an insulator or a semiconductor, so as to obtain the corresponding micro-area electrochemical and related information. The highest resolution currently achievable is about tens of nanometers. SECM has been applied to exp...

AI Technical Summary

Problems solved by technology

In this way, the problem of difficult preparation of the working electrode of the scanning electrochemical microscope can be solved, and the integrity of the test sample can be ensured and repeated reuse can be realized, thereby expanding the application range of the scanning electrochemical microscope and improving its use efficiency

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