Method for correcting radiation calibration data of long-wave infrared camera

Abstract

The invention provides a method for correcting radiation calibration data of a long-wave infrared camera, comprising the following steps of: imaging the temperature change black body at different temperatures by the long-wave infrared camera, and acquiring a radiation calibration data 1; acquiring the main source of stray radiation in the long-wave infrared camera through stray light analysis; imaging the temperature change black body at a certain fixed temperature by the long-wave infrared camera, and acquiring a imaging data 2; changing the temperature of each of stray radiation sources in the long-wave infrared camera, and acquiring the imaging data 3 separately; processing the imaging data 2 to obtain the correction relationship delta DNd between the focal plane temperature change of the long-wave infrared camera detector and the imaging data 2; processing the imaging data 3 to obtain the correction relationship delta DNs between the equivalent main body temperature of the long-wave infrared camera and the imaging data 3; and correcting the radiation calibration data 1 by using the correction relation delta DNd and the delta DNs. According to the method for correcting the radiation calibration data of a long-wave infrared camera, the radiation response linearity of the long-wave infrared camera is improved, the identification capability to targets with different temperatures is greatly improved, and a foundation is laid for accurate quantitative inversion work.

Description

technical field [0001] The invention relates to the field of radiation calibration, in particular to a correction method for radiation calibration data of a long-wave infrared camera. Background technique [0002] Mercury cadmium telluride (HgCdTe) ternary compound is the most ideal infrared detection material and has an irreplaceable status. Due to the extremely narrow band gap of the long-wave HgCdTe material, trace dislocations, defects, impurities, and thermal stress in the material will have a decisive impact on the performance of the detector, resulting in increased dark current and noise on the detector chip. It even causes device failure. Therefore, the radiation stray light inside the camera body or the fluctuation of the detector focal plane temperature has a great influence on the detector output signal. In order to obtain a real and effective image output, not only higher requirements are put forward for the preparation process of the mercury cadmium telluride d...

AI Technical Summary

Problems solved by technology

Due to the extremely narrow band gap of the long-wave HgCdTe material, trace dislocations, defects, impurities, and thermal stress in the material will have a decisive impact on the performance of the detector, resulting in increased dark current and noise on the detector chip. Even cause the device to fail, therefore, the radiation stray light inside the camera body or the fluctuation of the detector focal plane temperature has a great influence on the detector output signal

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