Processor for testing electronic devices
A technology of electronic components and processors, applied in the direction of measuring electricity, measuring electrical variables, and components of electrical measuring instruments, etc., can solve the problems of reduced test reliability, reduced processor operation rate, disturbed temperature environment of test room, etc. The effect of improving the operation rate and maintaining the reliability
Active Publication Date: 2019-03-01
TECHWING CO LTD
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Problems solved by technology
[0020] However, since the second conveying device operates only after the second conveying channel is opened after the test of the electronic components is finished, the transfer operation of the test tray by the second conveying device takes more time, which increases the load of the test tray. cycle time, and eventually cause the processor to operate at a reduced rate
In addition, since the time for opening the second delivery channel becomes longer, the time for the temperature environment in the test chamber to return to the test environment is also proportionally prolonged, which also leads to a decrease in the operating rate of the processor.
[0021] But if the second conveying channel is always open, the temperature environment of the heat removal chamber will disturb the temperature environment of the test chamber and reduce the reliability of the test
Method used
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[0056] Preferred embodiments of the present invention will be described with reference to the accompanying drawings, but descriptions of repeated or substantially identical structures are omitted or compressed as much as possible for conciseness of description.
[0057]
[0058] figure 1 is a conceptual top view of a processor 100 according to an embodiment of the present invention, figure 2 is in figure 1 A perspective view of the characteristic part P in the processor 100 of the present invention having the test tray TT passing through the transport channel TW between the test chamber TC and the heat removal chamber DC. refer to figure 1 and figure 2 , according to the processor 100 of this embodiment, comprising: a loading device 110, a constant temperature chamber SC, a test chamber TC, a first conveying device 120, a pressurizing device 130, a heat removal chamber DC, a second conveying device 140, an unloading device 150, The first opening and closing device 160 ...
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The invention relates to a processor for testing electronic devices. A delivery channel, which is used to deliver a test tray from a test room to a cooling room, is divided into a first region and a second region; wherein the length of the second region is shorter than the length of the first region. Before the first region is opened, the holding part of a holding member that is arranged on a second delivery device is moved to the test room through the second region in advance before the test starts. According to the technical scheme, when a test is finished, a test tray can be delivered fromthe test room to the cooling room, the circulation time of the test tray is shortened, and finally the efficiency of the processor is improved.
Description
technical field [0001] The invention relates to a processor for testing electronic components. Background technique [0002] Electronic components such as semiconductor devices produced are tested by a tester, then classified as qualified and non-conforming, and only qualified products are shipped. [0003] In order to test an electronic component, it is necessary to electrically connect the electronic component to a tester, and the electrical connection between the tester and the electronic component is performed by a processor for testing the electronic component (hereinafter referred to as "processor"). [0004] The processor may be manufactured in various forms according to test conditions for electronic components, types of electronic components, and the like. Among these various types, the present invention relates to a processor with a test chamber that can establish a test environment for electronic components. [0005] The main structure of the processor with the ...
Claims
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IPC IPC(8): G01R1/02G01R31/00
CPCG01R1/02G01R31/00G01R31/2867G01R31/2862G01R31/2868G01R31/2874
Inventor 罗闰成朴洙昌林采光金在虎
Owner TECHWING CO LTD