Intelligent test and analysis method for the whole ecological chain of integrated circuits

Abstract

The invention discloses an intelligent test and analysis method for the entire ecological chain of an integrated circuit, including a data acquisition layer, a big data processing analysis layer and an application layer, providing integrated circuit test parameter index analysis, wafer test yield analysis, test time analysis, crystal Circle MAP diagram information, SummaryCheck and analysis, TouchDown, Report, SQLHistory analysis; the intelligent test and analysis method for the entire ecological chain of integrated circuits provided by the present invention realizes the real-time performance, mobility and intelligence of the company's office, and has remote data intercommunication and remote data The characteristics of backup, high security, through continuous data accumulation, based on the data accumulation of 6 months to 1 year, the industrial big data analysis model is introduced to realize the data retrieval, tracking, analysis, early warning and prediction of the whole ecological chain test information Judgment, guide production, improve production efficiency and test yield.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, and more particularly, to an intelligent testing and analysis method for the entire ecological chain of integrated circuits. Background technique [0002] At present, my country's integrated circuit industry is facing an important period of strategic opportunities, innovation and tough times for development. On the one hand, the adjustment of the global market structure is accelerating, the scale of investment is rising rapidly, and the market share is accelerating to concentrate on advantageous enterprises; on the other hand, mobile smart terminals and chips are growing explosively, new formats such as the Internet, Internet of Things, and big data are developing rapidly, and new trends are emerging in the evolution of integrated circuit technology. [0003] In recent years, big data has been a very hot topic. When people talk about the opportunities and value brought by massi...

AI Technical Summary

Problems solved by technology

[0011] In the existing technology, the integrated circuit testing environment is in clean workshops such as class 1000, class 100, and class 10. Production operators need to supervise multiple devices. processing, and it may not be possible to quickly locate the problem. The distance between machines, abnormal conditions, personnel, and timeliness of abnormal discovery will all affect the processing efficiency. Rapid processing, the equipment can only stop working, resulting in waste of machine time and low production capacity

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