Method for preparing infrared detector
An infrared detector and dielectric layer technology, which is applied in the field of infrared detectors, can solve the problems of increased detector dead points, poor conductivity, and low yield, so as to enhance conductivity and reliability, and solve the problem of pixel size. Small, repeatable results
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[0046] Figure 14 It is a schematic flow chart of the preparation method of an infrared detector of the present invention. Such as Figure 14 Shown, a kind of preparation method of infrared detector generally can comprise the following steps:
[0047] S1. Uniformly coating polyimide layer 2 on integrated circuit wafer substrate 1, and curing at high temperature;
[0048] S2. Coating photoresist on the polyimide 2, and performing plasma reactive etching on the polyimide to form the channel pattern I3 at the pier;
[0049] S3. depositing the first dielectric layer 4 to cover the polyimide;
[0050] S4. Depositing the thermally sensitive film 5 and the second dielectric layer 6 in sequence; and etching the second dielectric layer 6 and the thermally sensitive film 5 by photolithography to form a predetermined pattern;
[0051] S5. depositing the third dielectric layer 7 as a protective film;
[0052] S6. Coating photoresist and etching the bridge pier to form channel pattern...
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