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Apparatus and method for predicting product processing quality based on cross-step implicit parameter memory

A quality prediction and processing quality technology, which is applied in the field of product processing quality prediction devices based on implicit parameter memory across steps, and can solve problems such as the decline of model prediction accuracy.

Active Publication Date: 2019-03-15
ZHEJIANG UNIV
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Problems solved by technology

In this process, the impact of the chamfering step on the implicit quality characteristics of the grinding step is less than that of the finishing step on the grinding step. The impact of the grinding process, resulting in a decrease in the prediction accuracy of the model

Method used

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  • Apparatus and method for predicting product processing quality based on cross-step implicit parameter memory
  • Apparatus and method for predicting product processing quality based on cross-step implicit parameter memory
  • Apparatus and method for predicting product processing quality based on cross-step implicit parameter memory

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Embodiment Construction

[0083] The present invention will be further described below in conjunction with drawings and embodiments.

[0084] Such as figure 2 Shown, embodiment of the present invention and concrete implementation process thereof are as follows:

[0085] Step 1. Data Acquisition

[0086] The process parameter data in each station step in the product processing procedure is acquired through multiple sensors as input characteristic data, including process parameters and measurement parameters in each station step in the product processing procedure. Input characteristics of each station step such as: cutting speed, feed rate, depth of cut, spindle speed, workpiece speed, processing time, back engagement, feed times, eccentricity, blank material category, tool material category, tool The geometric angle, fixture category number, cutting fluid category, measurement dimension accuracy, measurement shape accuracy, measurement position accuracy, etc.

[0087] This step is reflected in the d...

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Abstract

The invention discloses a device and a method for predicting the processing quality of a product based on the memory of implicit parameters across steps. The device comprises a data acquisition module, a data preprocessing module, a quality prediction model construction module, a parameter optimization module, a quality characteristic prediction module and an online update module. Methods includedata acquisition; Data preprocessing (outlier processing of sample data, grouping and sorting according to the characteristics of the product manufacturing process, processing of unknown input characteristics in the group, sample equalization and random resampling in the workstation step of unbalanced data set, dimension reduction of the characteristics in the group); Construction of quality prediction model (construction of quality prediction model structure, optimization training of model parameters); A step of predicting quality characteristics of a sample to be measured. The invention canautomatically obtain the influence between the process parameters of the discrete manufacturing process across the working steps, and has higher product quality prediction accuracy, flexibility, prediction efficiency and model reusability.

Description

technical field [0001] The invention relates to a quality prediction device and method in the product manufacturing process, in particular to a product processing quality prediction device and method based on implicit parameter memory across working steps. Background technique [0002] The measurement of quality characteristics in the product manufacturing process is often a high-cost, low-efficiency process. At the same time, many quality measurements have a destructive effect on the product, resulting in the complete scrapping of a product. Therefore, it is very necessary to provide a product quality prediction device and method, establish a mapping relationship between process parameters and quality characteristics, and reduce cost loss and time loss caused by experimental measurement of product quality characteristics. However, for discrete manufacturing, a common manufacturing mode, there are some technical difficulties. The production process of discrete manufacturing...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06N3/04G06N3/08
CPCG06N3/08G06F30/20G06N3/045Y02P90/30
Inventor 刘振宇张栋豪郏维强刘惠谭建荣
Owner ZHEJIANG UNIV
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