Novel component test fixture

A technology for testing fixtures and components, which is applied to parts, instruments, and measuring electronics of electrical measuring instruments. It can solve problems such as unstable quality, low efficiency, and design quality depending on personal experience and habits, and achieve wide versatility. The effect of accurate testing

Inactive Publication Date: 2019-03-22
四川九洲空管科技有限责任公司
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Designers have a heavy workload and low efficiency; design quality depends on personal experience and habits, the quality

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Novel component test fixture
  • Novel component test fixture

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0019] The present invention will be further described below in conjunction with the drawings.

[0020] Such as figure 1 , 2 As shown, a new type of component test fixture specifically includes a fixture base, a fixed baffle, a test probe, a PCB circuit board, an upper cover, a lower cover and an SMA connector. The fixture base is an upper surface, a lower A tetrahedral structure with a hollow surface and an inner hollow; the SMA connector is fixed on the side wall of the fixture base and passes through the side wall of the fixture base; the part of the SMA connector that passes through the side wall has a support part, so A PCB circuit board is installed on the supporting part; a test pointer is welded on the PCB circuit board, and the test pointer is arranged vertically, and the upper part of the test pointer is the placement area of ​​the device under test; the fixed baffle is arranged on the device under test Around the placement area, the fixed baffle is fixedly connected wi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the field of test fixtures, and discloses a novel component test fixture which particularly comprises a fixture base, fixing barriers, test probes, a PCB (printed circuit board), an upper cover plate, a lower cover plate and SMA insertion components. The fixture base is of a tetrahedron structure with the hollowed-out upper surface, the hollowed-out lower surface and the hollowed-out inside; the SMA insertion components are fixed onto the side walls of the fixture base and penetrate the side walls of the fixture base; support portions are arranged the portions, which penetrate the side walls of the fixture base, of the SMA insertion components, and the PCB is mounted on the support portions; test pointers are welded on the PCB and are vertically arranged, and tested component placing regions are arranged above the test pointers; the fixing barriers are arranged on the peripheries of the tested component placing regions and are fixedly connected with the fixturebase, and the upper cover plate and the lower cover plate cover the fixture base via screws. According to the technical scheme, the novel component test fixture has the advantage that tested components can be quickly, safely and accurately tested by the novel component test fixture.

Description

technical field [0001] The invention relates to the field of test fixtures, in particular to a novel component test fixture. Background technique [0002] With the advancement of technology and the rapid development of electronic products, there are more and more types of components and their complexity is getting higher and higher. At present, there is no general-purpose test fixture on the market that can test the performance parameters of different components, and different test fixtures need to be used for testing components of different manufacturers. [0003] The test fixture, also known as the test frame, is to place the components or the circuit board with soldered electronic components on the bracket equipped with several test probes, so that some predetermined solder points are accurately in contact with the test pins, and then test Determine whether the device or circuit board is working normally. The test fixture test has the advantages of fast test speed and l...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R1/04G01R1/067
CPCG01R1/0408G01R1/06711
Inventor 秦银
Owner 四川九洲空管科技有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap