A fatigue failure algorithm of stress-cycle number (S-N) based on finite element method
A technology of fatigue failure and cycle times, applied in calculation, electrical digital data processing, special data processing applications, etc., can solve problems that cannot be well solved by scientific description, and achieve the effect of convenient prediction of remaining life and convenient calculation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0043] In the statistical engineering of stress tensor history, the present invention first needs to consider the compression of time history. The time for fatigue analysis is a function of the number of entities (nodes and elements), load cases (for superimposed events), type of analysis, and time series loading (number of time series data points). One way to reduce analysis time is to reduce the number of data nodes to process during analysis. The present invention provides a processing method, which adopts a peak-valley compression method. In fact, this approach provides a reduced control option for the number of nodes in the time series prior to linear superposition.
[0044] This feature is controlled via the Time History Compression property on each analysis run, which can be None, PeakValley, or Limits.
[0045] A setting of None means that the entire load time history will be run without compression.
[0046] Setting it to PeakValley means that the time series will ...
PUM

Abstract
Description
Claims
Application Information

- Generate Ideas
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com