Single pulse ionization very short time self-measurement scheme
An extremely ionized, short-time technology, applied in the direction of instruments, etc., can solve problems such as uncertain laser intensity and difficult control of carrier envelope phase
Active Publication Date: 2020-10-16
SHANTOU UNIV
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Problems solved by technology
However, because the carrier envelope phase is not easy to control and the laser intensity is uncertain, it is now possible to generate infrared laser pulses with a pulse width of only a few optical cycles and extreme ultraviolet laser pulses (Extreme ultraviolet, XUV) with a pulse width of only a few attoseconds. The attosecond pulse generated by the pulse can only measure the single photon ionization process, and the laser needs to superimpose multiple frequencies
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[0015] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.
[0016] refer to Figure 1-Figure 3 , the specific embodiment adopts the following technical solutions: a single pulse ionization self-measurement device in a very short time, including a laser (laser power is on the order of terawatts) 1, an upper detector 2, a lower detector 3 and a target atomic chamber 4, and the laser 1 The right side is equipped with the target atom chamber 4 containing the atoms of the experimental materials. After the laser is turned on and stabilized, the target atom chamber 4 ejects individual atoms through the nozzle each time. The laser 1 on the left emits a beam of ultrashort laser pulses. Under the action, the atoms are ionized into electrons and ions. Under the action of the magnetic field in the device, the electron...
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The invention discloses a single-pulse ionization extremely-short time self-measuring scheme. The single-pulse ionization extremely-short time self-measuring scheme utilizes a high-power laser to control the magnitude of a carrier-envelope phase of a monochromatic field to obtain different electron momentum spectrums of multiphoton ionization, then electron energy is arrayed from low to high, electrons with the same energy generate interference, then each order of ATI is separated separately, the ATI is separately fit to obtain a phase position phi of a fitting function, the phase position phiis converted into time quantum with attosecond as the unit, and the single-pulse ionization extremely-short time is measured. The technology is applied to atoms, molecules, nanostructures and solid surfaces, and thus the extremely-short time of some ultrafast process can be detected, and in addition, the extremely-short time of dynamic behavior of atomic molecules or electrons in condensed mattercan further be studied.
Description
technical field [0001] The invention relates to a method for measuring time delay, in particular to a single-pulse ionization self-measurement scheme in a very short time. Background technique [0002] There are many ultrafast processes in nature, such as tracing the trajectory of electrons in the time scale of experiments, observing the formation and breaking of chemical bonds during chemical reactions, or observing how electrons ionize from atoms or molecules, etc. To study the dynamic behavior of electrons in atomic molecules or condensed matter, laser pulses with sub-femtosecond or even attosecond time precision are required. However, because the carrier envelope phase is not easy to control and the laser intensity is uncertain, it is now possible to generate infrared laser pulses with a pulse width of only a few optical cycles and extreme ultraviolet laser pulses (Extreme ultraviolet, XUV) with a pulse width of only a few attoseconds. The attosecond pulse generated by ...
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IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 杨玮枫李洁时光罗
Owner SHANTOU UNIV