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Defect displaying method in back light detection

A defect display and backlight technology, which is applied in the direction of optical defect/defect test, material analysis through optical means, measurement device, etc., can solve the problem of low efficiency of BLU defect detection, relieve human eye fatigue, improve efficiency and accuracy , the effect of improving work efficiency

Inactive Publication Date: 2019-04-12
WUHAN JINGLI ELECTRONICS TECH
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Problems solved by technology

[0003] The embodiment of the present application solves the problem of low BLU defect detection efficiency in the prior art by providing a method for displaying defects in backlight inspection

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Embodiment Construction

[0031] In order to better understand the above-mentioned technical solution, the above-mentioned technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0032] The design process of the existing BLU defect AOI detection system is generally divided into five processes: personnel loading, AOI image detection, personnel re-judgment of defects, defect marking, and personnel unloading. In these five processes, the time for personnel loading and unloading, AOI imaging detection and defect marking is basically fixed and will not change much, but the process of personnel re-judgment is subject to the type, size and area of ​​defects. AOI detection Only the coordinates on the map are given, and the actual characteristics of the defect have to be observed repeatedly by human eyes. Due to the small size and low contrast of the backlight defect, it will be very time-consuming to observe the defect with human ...

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Abstract

The invention belongs to the technical field of defect detection, and discloses a defect displaying method in back light detection. The defect displaying method comprises the following steps that a first area is cut out in a BLU drawing-document according to defect coordinate information detected by AOI, and a first defect drawing is obtained; the first defect drawing is subjected to magnifying orenhancing treatment, and a second defect drawing is obtained; the second defect drawing is drawn in the first area of the BLU drawing-document, and a defect displaying drawing is obtained. Accordingto the defect displaying method in the back light detection, human eyestrain can be greatly relieved, the working efficiency is improved, the time cost is reduced, defect evaluation can be carried outrapidly and accurately, and the efficiency and accuracy of the performance test of an AOI defect detecting system are further improved.

Description

technical field [0001] The invention relates to the technical field of defect detection, in particular to a method for displaying defects in backlight inspection. Background technique [0002] In the BLU (Back Light Unit, backlight component) process, from the module frame to the top, reflective sheets, light guide plates, diffusers, prism sheets, light guide films, etc. will be added in sequence, and each layer of sheet material can be added Causes defects such as dirt, foreign matter, creases, scratches, etc., and defects located in different layers have the characteristics of irregular shape, uneven size, unstable position, low contrast and inconsistency. In the AOI (Automatic Optic Inspection, automatic optical inspection) inspection process, after the machine is detected, it is necessary to observe the position and characteristics of the defect on the drawing with human eyes, and then search for the defect information on the actual backlight at the corresponding positio...

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Application Information

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IPC IPC(8): G01N21/88
CPCG01N21/8851
Inventor 陈武张胜森郑增强
Owner WUHAN JINGLI ELECTRONICS TECH
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