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Embedded large-capacity parallel multi-channel optical module error code test system and test method

A technology of bit error testing and large capacity, applied in the field of optical communication, can solve the problems of low test efficiency, occupying a lot of resources, easy to make mistakes, etc., and achieve the effect of easy single-chip integration, less resource occupation, and design optimization.

Active Publication Date: 2019-04-23
WUHAN HENGTAITONG TECH
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Problems solved by technology

[0004] The disadvantage of this is that the test efficiency is low and it takes up a lot of resources, so many manufacturers can only use the method of random testing, and multi-channel parallel testing at the same time. requirements

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  • Embedded large-capacity parallel multi-channel optical module error code test system and test method
  • Embedded large-capacity parallel multi-channel optical module error code test system and test method
  • Embedded large-capacity parallel multi-channel optical module error code test system and test method

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Embodiment Construction

[0054] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0055] see Figure 1-Figure 2 , the embedded large-capacity parallel multi-channel optical module bit error testing system disclosed in the preferred embodiment of the present invention includes a control interface unit 101, a transmitting part and a receiving part, and the transmitting part is such as figure 1 As shown, the receiving part is as figure 2 shown.

[0056] The sending part includes a sending end PRBS generator 102 and parallel multiplex sendin...

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Abstract

The invention relates to an embedded large-capacity parallel multi-channel optical module error code test system and test method. The embedded large-capacity parallel multi-channel optical module error code test system includes a sending part and a receiving part; the sending part uses PRBS sequence equalization and characteristics of shift addition to achieve parallel expansion through serial shift or intermediate extraction; and the receiving part uses the method of multi-channel operation and combined channel re-synchronizing, which has the characteristics of parallel multi-channel independent channels, and can fully utilize the timing sequence correlation of each independent channel; so that the large-capacity optical module error test is realized. The embedded large-capacity parallelmulti-channel optical module error code test system and test method satisfies the mass test of communication components and modules, and solves the false test caused by the error of the jumper connection of a common code error tester at the same time; and the design is optimized and facilitates the monolithic integration.

Description

technical field [0001] The invention relates to the field of optical communication, in particular to an embedded large-capacity parallel multi-channel optical module error testing system and a testing method thereof. Background technique [0002] Bit error performance test is an important item to measure the performance of digital communication system equipment, usually using a special bit error tester to measure its bit error performance. The basic principle is that the BER tester sends out a series of standard PRBS sequences, and then returns to the BER tester after passing through the system equipment to be tested. The BER tester judges the error rate of the communication system equipment by comparing the number of bit errors in the received sequence and the transmitted sequence. BER performance. [0003] For communication equipment components and modules, since the complete equipment has not yet been formed, in order to test the bit error performance of individual compo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/077
CPCH04B10/0775H04B10/0779
Inventor 王亚丽肖海清杨国民
Owner WUHAN HENGTAITONG TECH
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