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Wheat grain parameter measuring device for individual wheat, and threshing and measuring system for individual wheat

A technology of parameter measurement and measurement system, applied in measurement devices, optical devices, weighing, etc., can solve the problems of unsatisfactory evaluation efficiency, bulky body, complex structure, etc., and achieve online measurement, evaluation efficiency improvement, structure simple effect

Active Publication Date: 2019-05-07
BEIJING RES CENT OF INTELLIGENT EQUIP FOR AGRI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing measuring devices are complex in structure and bulky in size, and it is difficult to transport them to the wheat field for online measurement of a single ear of wheat, resulting in the evaluation efficiency not meeting the requirements

Method used

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  • Wheat grain parameter measuring device for individual wheat, and threshing and measuring system for individual wheat
  • Wheat grain parameter measuring device for individual wheat, and threshing and measuring system for individual wheat
  • Wheat grain parameter measuring device for individual wheat, and threshing and measuring system for individual wheat

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Embodiment 1

[0036] Such as Figure 1 to Figure 3 As shown, the embodiment of the present invention provides a device for measuring grain parameters of a single ear of wheat, which device includes an image data processing unit, a housing 1-1, a measurement box 3 and an image acquisition unit arranged in the housing 1-1 The measuring box 3 can be drawn and arranged on the lower part of the shell 1-1, the measuring box 3 is provided with a sample tray 4 for placing wheat grains, and a load cell 5 is arranged between the sample tray 4 and the measuring box 3; image acquisition The unit is suspended above the sample tray 4 and is used to collect images of wheat grains on the sample tray 4; the image acquisition unit and the load cell 5 are respectively electrically connected to the image data processing unit.

[0037] It can be seen that the device is simple in structure and light in size, so the staff can directly carry the device to the wheat field site before measurement. When measuring: f...

Embodiment 2

[0044] The invention provides a system for threshing and measuring single ear of wheat, the system includes a wheat thresher and the above-mentioned device for measuring parameters of wheat ear of single plant. Wherein, the structure and principle of the device for measuring the grain parameters of a single ear of wheat are the same as those in Embodiment 1, and will not be repeated in this embodiment. Such as Figure 5 and Figure 6 As described above, the wheat thresher includes a base 7 and a blower 8, a casing 9, a seed collection box 12 and a rotary drive unit arranged on the base 7; both sides of the casing 9 are respectively provided with an air inlet 9-1 and a waste port 9 -2, the blower 8 is set close to the air inlet 9-1; the casing 9 is provided with a first drum 10 and a second drum 11 arranged in parallel, and the rotary drive unit is used to drive the first drum 10 and the second drum 11 to rotate in opposite directions; The top surface and the bottom surface o...

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Abstract

The invention relates to the field of agricultural machinery and equipment and provides a wheat grain parameter measuring device for individual wheat and a threshing and measuring system for the individual wheat. The device comprises an image data processing unit, a measuring box, a case, and an image acquisition unit arranged within the case. The measuring box is detachably arranged at a lower portion of the case; a sample tray for placing the grain is provided in the measuring box; a weighing sensor is arranged between the sample tray and the measuring box; the image acquisition unit is suspended above the sample tray for collecting an image of the grain placed on the sample tray; and the image acquisition unit and the weighing sensor are electrically connected with the image data processing unit respectively. The system comprises a wheat thresher and the wheat grain parameter measuring device for individual wheat. According to the wheat grain parameter measuring device for individual wheat, and the threshing and measuring system for the individual wheat, the invention has a simple structure and is convenient to move; staff can use the device to achieve online measurement of grain parameters, so that the efficiency of wheat yield and quality assessment can be greatly improved.

Description

technical field [0001] The invention relates to the field of agricultural machinery and equipment, in particular to a device for measuring grain parameters of a single ear of wheat, and a system for threshing and measuring a single ear of wheat. Background technique [0002] At present, as the evaluation of wheat quality and yield gradually tends to be refined, people's requirements for evaluation efficiency are also gradually increasing. Parameters such as the number of grains, average weight, and average circumference of a single ear of wheat are important basis for evaluating wheat quality and yield. However, the existing measurement devices are complex in structure and bulky in size, and it is difficult to transport them to the wheat field for online measurement of a single ear of wheat, resulting in the evaluation efficiency not meeting the requirements. Contents of the invention [0003] The object of the present invention is to provide a device for measuring grain ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02G01B11/08G01B11/28G01G17/04
Inventor 李翠玲王秀马伟张春凤杨硕
Owner BEIJING RES CENT OF INTELLIGENT EQUIP FOR AGRI
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