Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A measuring device and method for calibrating tooling and intermating gap of blind mating connectors

A measurement device and measurement method technology, applied in the direction of measurement devices, instruments, etc., can solve problems such as poor consistency of measurement data, and achieve the effects of simple test tooling, good consistency, and high test efficiency

Active Publication Date: 2020-08-14
FENGHUO COMM SCI & TECH CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] In view of the defects existing in the prior art, the object of the present invention is to provide a measuring device for the intermating gap of blind mating connectors, which can avoid the problem of poor consistency of measurement data caused by multiple measurements and calculations, And not limited by the test conditions, the whole test tooling is simple and easy to operate, with high test efficiency and high test accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A measuring device and method for calibrating tooling and intermating gap of blind mating connectors
  • A measuring device and method for calibrating tooling and intermating gap of blind mating connectors
  • A measuring device and method for calibrating tooling and intermating gap of blind mating connectors

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0050] see Figure 4 to Figure 8 As shown, the embodiment of the present invention provides a measuring device for the mating gap of blind mating connectors, which includes a calibration tool 1 and a simulation board 2 .

[0051] Wherein, a groove 11 is provided on the calibration tool 1, and the depth S of the groove 11 is the part of the pin length used for docking the signal pin on the backplane connector with the chassis connector plus the thickness of the shell bottom of the backplane connector. .

[0052] Emulator Disk 2, which includes,

[0053] - disc body 21;

[0054] - a plurality of machine disk connectors, which are all fixed on the disk body 21;

[0055] - At least one displacement sensor 22, which is fixed on the disc body 21 and is arranged adjacent to one of the disc connectors, and the part of the displacement sensor 22 protruding from the disc body 21 exceeds the disc the length of the connector is slightly greater than said depth S;

[0056] - a displac...

Embodiment 2

[0064] see Figure 4 to Figure 8 As shown, the embodiment of the present invention provides a measuring device for the mating gap of blind mating connectors, which includes a calibration tool 1 and a simulation board 2 .

[0065] Wherein, a groove 11 is provided on the calibration tool 1, and the depth S of the groove 11 is the part of the pin length used for docking the signal pin on the backplane connector with the chassis connector plus the thickness of the shell bottom of the backplane connector. .

[0066] Emulator Disk 2, which includes,

[0067] - disc body 21;

[0068] - a plurality of machine disk connectors, which are all fixed on the disk body 21;

[0069] - At least one displacement sensor 22, which is fixed on the disc body 21 and is arranged adjacent to one of the disc connectors, and the part of the displacement sensor 22 protruding from the disc body 21 exceeds the disc the length of the connector is slightly greater than said depth S;

[0070] - a displac...

Embodiment 3

[0074] see Figure 4 to Figure 8 As shown, the embodiment of the present invention provides a measuring device for the mating gap of blind mating connectors, which includes a calibration tool 1 and a simulation board 2 .

[0075] Wherein, a groove 11 is provided on the calibration tool 1, and the depth S of the groove 11 is the part of the pin length used for docking the signal pin on the backplane connector with the chassis connector plus the thickness of the shell bottom of the backplane connector. .

[0076] Emulator Disk 2, which includes,

[0077] - disc body 21;

[0078] - a plurality of machine disk connectors, which are all fixed on the disk body 21;

[0079] - At least one displacement sensor 22, which is fixed on the disc body 21 and is arranged adjacent to one of the disc connectors, and the part of the displacement sensor 22 protruding from the disc body 21 exceeds the disc the length of the connector is slightly greater than said depth S;

[0080] - a displac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a measuring device and method for the intermatching gap of blind mating connectors, and relates to the field of measuring the intermatching gap between machine disks and backplane connectors, including: a calibration tool, which is provided with a groove, the depth of which is S is part of the pin length for docking the signal pin on the backplane connector with the chassis connector plus the thickness of the bottom of the backplane connector shell; and the analog chassis, which includes a chassis body; a plurality of chassis connectors, its Both are fixed on the disk body; at least one displacement sensor is fixed on the disk and is arranged adjacent to a disk connector, and the length of the part of the displacement sensor protruding from the disk beyond the disk connector is slightly greater than the depth S ; A displacement tester, which is connected with the displacement sensor and used to read the data of the displacement sensor. The invention can avoid the problem of poor consistency of measurement data caused by multiple measurements and calculations, and is not limited by test conditions. The whole test tooling is simple and easy to operate, with high test efficiency and high test accuracy.

Description

technical field [0001] The invention relates to the field of measuring the intermatching gap between a chassis and a backplane connector, in particular to a measuring device and method for a blind mating connector intermatching gap. Background technique [0002] The intermating clearance (Demated value) between the chassis connector and the subframe backplane connector directly affects the reliability of the product, and many signal failures are related to the excessively large value. Demated value specific reference figure 1 and figure 2 As shown, the factors that affect the Demated value include the processing and assembly errors of the machine disk, the processing and assembly errors of the sub-frame, and the deformation of the machine disk after being inserted and removed from the backplane. All influencing factors are in a normal distribution state, how to accurately and efficiently measure the Demated value has become an urgent problem to be solved in the design and...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/16
CPCG01B21/16
Inventor 何丽平周海
Owner FENGHUO COMM SCI & TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com