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Non-contact type lens center thickness measurement system and method

A lens-centered, non-contact technology, applied in the field of optical measurement, can solve the problems of difficult wide application, complex device, cumbersome measurement, etc., and achieve the effect of low cost, reduced requirements, and simple operation mode

Inactive Publication Date: 2019-05-17
NANJING UNIV OF INFORMATION SCI & TECH
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  • Abstract
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Problems solved by technology

The patent with the publication number CN104154869A discloses a white light interference lens center thickness measurement system and method, which has the advantages of accurate measurement and high resolution, but its cost is high and it is difficult to be widely used
The patent with the publication number CN102435146 discloses a device for measuring the center thickness of the lens based on the confocal method. The device is complicated, the cost is high, and the measurement is cumbersome
[0004] Therefore, the current non-contact measurement method of optical lens center thickness has the technical problems of complex equipment, high cost and cumbersome measurement, and has not yet been popularized in ordinary optical factories.

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  • Non-contact type lens center thickness measurement system and method
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  • Non-contact type lens center thickness measurement system and method

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Embodiment Construction

[0033] The following description and drawings illustrate specific embodiments of the invention sufficiently to enable those skilled in the art to practice them. Other embodiments may incorporate structural, logical, electrical, process, and other changes. The examples merely represent possible variations. Individual components and functions are optional unless explicitly required, and the order of operations may vary. Portions and features of some embodiments may be included in or substituted for those of other embodiments. The scope of embodiments of the present invention includes the full scope of the claims, and all available equivalents of the claims.

[0034] Such as figure 1 and 2 As shown, in some illustrative embodiments, the present invention provides a non-contact lens center thickness measurement system, including: a probe 1, a host computer 2, a sample clamping device 3, a Z-axis electric translation stage module 4, Electronic control module 5 and probe suppor...

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Abstract

The invention provides a non-contact type lens center thickness measurement system. The system comprises a probe, an upper computer, a sample piece clamping device, a Z-axle electric translation platform module, an electronic control module and a probe support structure. The invention further provides a non-contact type lens center thickness measurement method. The method comprises the following steps: the Z-axle electric translation platform module drives a to-be-measured lens to move, and shoots a reflecting image of an object point array after moving a certain distance; the upper computer computes the size of the object point image in real time, and recording conjugate plane location information corresponding to each object point and fitting to acquire a surface shape at a surface center of the lens, and further computing the distance between peaks of two surfaces to acquire the lens center thickness. The system has a non-contact advantage, the influence on the surface quality of the lens by the measurement is avoided, the influence caused by the inclined installation of the lens is overcome at the same time, and the measurement efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, and in particular relates to a non-contact lens center thickness measurement system and method. Background technique [0002] Optical lenses can manipulate the trajectory of light rays and are widely used in various optical systems. The central thickness of the lens is an important parameter that affects the processing accuracy of the lens. The processing error may lead to the change of the focal length of the lens, which will lead to the discrepancy between the actual optical parameters of the system and the design parameters, and reduce the optical performance. High-performance optical system products have strict requirements on the tolerance of the lens center thickness, so it is an essential link to perform high-precision detection of the lens center thickness after processing. [0003] At present, in the lens center thickness measurement method, the contact measurement method is...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
Inventor 曹兆楼李潇潇裴世鑫刘玉柱咸冯林李金花叶井飞
Owner NANJING UNIV OF INFORMATION SCI & TECH
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