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Automatic test system for abnormity of process layer of intelligent relay protection device

A relay protection device and automatic test system technology, which is applied in the direction of circuit breaker testing, etc., can solve problems such as difficulty in coordination, influence on experimental results, and difficult control of network data coordination at the process level.

Pending Publication Date: 2019-06-07
XUCHANG KETOP DETECTION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Due to the abnormal test of the process layer network of the current relay protection device, it is necessary to manually control the abnormal output of the relay protection tester, and it is necessary to manually handle the simulated fault and simulate the process layer abnormality. The degree of cooperation is relatively difficult, which affects the experimental results, and Every abnormality needs to be manually operated, which is time-consuming, making it difficult to control the data coordination in the process layer network

Method used

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  • Automatic test system for abnormity of process layer of intelligent relay protection device
  • Automatic test system for abnormity of process layer of intelligent relay protection device
  • Automatic test system for abnormity of process layer of intelligent relay protection device

Examples

Experimental program
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Effect test

Embodiment 1

[0037] An automatic test system for abnormalities in the process layer of an intelligent relay protection device, such as figure 1 As shown, an upper computer 100, an industrial computer 200, and a process layer network 300 are provided; the upper computer 100 is connected to the industrial computer 200 and the device under test 400 respectively, and the process layer network 300 is connected to the industrial computer 200 and the device under test 400 respectively.

[0038] The host computer 100 sends the test command to the industrial computer 200, and the industrial computer 200 calculates the test data to be sent to the device under test 400 and the information to be collected according to the test command to form a second command.

[0039] The industrial computer 200 sends the test data to the device under test 400 through the process layer network 300 according to the calculated second command, and collects the corresponding action information after the device under test ...

Embodiment 2

[0051] An automatic test system for abnormalities in the process layer of an intelligent relay protection device, the other structures are the same as in Embodiment 1, the difference is that, as figure 2 As shown, the abnormal automatic test system of the process layer of the intelligent relay protection device,

[0052] Specifically, the upper computer 100 is also provided with a background simulation model 104, and the background simulation model 104 is connected with the command component 101, the file parsing component 102, the comparison component 103 and the CPU processing component 201 respectively; The test command, the file analysis component 102 parses the information, the comparison result of the comparison component 103 and the action information output by the CPU processing component 201, and forms a mapping model.

[0053] By setting the background simulation model, the background simulation model will continuously collect and record the test commands of the com...

Embodiment 3

[0055] An automatic test system for abnormalities in the process layer of an intelligent relay protection device, the other structures are the same as in Embodiment 1 or 2, the difference is that, as image 3 As shown, the industrial computer 200 is also provided with an SV interface and a GOOSE interface. The SV interface is connected to the SV network 301 and the FPGA component 202; respectively, and the GOOSE interface is connected to the GOOSE network 302 and the FPGA component 202; respectively.

[0056] Specifically, the upper computer 100 is also provided with a first connection interface and a second connection interface, and the first connection interface is respectively connected to the command component 101, the device under test 400, and the file analysis component 102;

[0057] Specifically, the second connection interface is respectively connected to the command component 101 , the comparison component 103 , the CPU processing component 201 and the background simu...

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Abstract

Provided in the invention is an automatic test system for abnormity of a process layer of an intelligent relay protection device. The system is provided with an upper computer, an industrial personalcomputer, a process layer network and a tested device. The upper computer is in signal connection with the industrial personal computer and the tested device. The process layer network is connected with the industrial personal computer and the tested device. The upper computer sends a test command to the industrial personal computer; the industrial personal computer carries out calculation based on the test command to form a second command and sends testing data to the tested device via the process layer network; the industrial personal computer collects corresponding action information of thetested device after receiving of the testing data and feeds back the action information to a file parsing assembly of the upper computer; the file parsing assembly parses the action information and sends the parsed information to a comparison assembly; and the comparison assembly carries out comparison and determination on the test command based on the parsed action information. According to theautomatic test system, analog output quantity of the process layer network can be calculated automatically; the manual calculation fault can be avoided; the accuracy is improved; and the automatic testing is realized.

Description

technical field [0001] The invention relates to the technical field of power relay protection, in particular to an automatic test system for process layer abnormality of an intelligent relay protection device. Background technique [0002] In the field of power system relay protection, the process layer network is extremely important. The process layer network contains various data information of the device under test, such as analog information, voltage, current, switch position and trip information. When the process layer network is abnormal, it will cause the data information in it to be abnormal. Therefore, the test for the process layer network abnormality is also a problem that is paid more and more attention. [0003] Due to the abnormal test of the process layer network of the current relay protection device, it is necessary to manually control the abnormal output of the relay protection tester, and it is necessary to manually handle the simulated fault and simulate ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327
Inventor 贺春陈新美赵华云孙迅雷郑蓬刘洛阳李卫东张又珺刘园伟王俊辉任春梅银庆伟范艳峰李嘉原晓磊
Owner XUCHANG KETOP DETECTION TECH CO LTD