A method for quickly testing an SPI communication module

Abstract

The invention discloses a method for quickly testing an SPI (serial peripheral interface) communication module, which is used for the communication based on a serial interface and comprises the following steps of S1, specifying a communication protocol between an upper computer and a lower computer; S2, using the upper computer to automatically configure an SPI module, generate a configuration table of the test case by using the SPI module, and convert the configuration table into a corresponding test instruction; S3, enabling the upper computer to communicate with the lower computer; and S4,after receiving the test instruction, using the lower computer to analyze the configuration instruction, and initialize the SPI of the chip according to the configuration information of the configuration instruction, so that the SPI works in an appointed working mode of the upper computer. According to the test method, nearly 100 thousands of cases of the SPI module can be fully automatically tested, the serial peripheral interface module can be quickly and efficiently tested, the test period of the SPI module is shortened, and the labor cost and the time cost consumed on the SPI module are greatly reduced.

Description

technical field [0001] The invention belongs to the technical field of communication module testing, in particular to the testing of 32-bit chip SPI communication modules based on Cortex M series cores. Background technique [0002] SPI (Serial Peripheral Interface) is a serial peripheral interface, which is a high-speed, full-duplex, synchronous communication bus. With the development of communication technology, the serial peripheral interface is widely used in various general-purpose chips because of its multiple working modes, flexible configuration, good compatibility, and high communication speed. The SPI module has gradually become a very important part of the chip. important peripheral modules. [0003] In the current chip design, in order to ensure various performance indicators of the chip, it is often necessary to test and verify it in multiple stages of chip design. However, on the one hand, the SPI module is compatible with various communication protocols such...

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Problems solved by technology

[0005] However, the application discloses that the upper computer and the lower computer are used for testing, but for the SPI module, the above method cannot cover many test cases, and the test efficiency is low

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