Double-station electrical test device

An electrical testing, dual-station technology, applied in electronic circuit testing and other directions, can solve problems such as low work efficiency, and achieve the effect of improving applicability and improving detection efficiency.

Active Publication Date: 2019-06-25
信泰电子(西安)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, in the above-mentioned technical scheme, only one PCB board can be tested at a time, so that the work efficiency is low

Method used

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  • Double-station electrical test device

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Experimental program
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Embodiment Construction

[0036] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0037] refer to figure 1, is a dual-position electrical testing device disclosed in the present invention, comprising a workbench 1, an upper detection board 111 and a lower detection board 121, wherein a first cylinder 13 is arranged on the workbench 1 along the vertical direction, and the first The piston rod end of the cylinder 13 is provided with a lower detection platform 12, and one side of the workbench 1 is hinged with an upper detection platform 11. above.

[0038] refer to figure 2 , the lower testing platform 12 and the upper testing platform 11 are provided with accommodating grooves, the lower testing platform 12 and the upper testing platform 11 are connected with baffle plates 123 by bolts on both sides of the accommodating grooves, and one end of the baffle plate 123 Stretch out accommodating groove, and be positioned at the notch top of a...

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PUM

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Abstract

The invention relates to a double-station electrical test device, belonging to the technical field of electrical performance test of a semiconductor device. The double-station electrical test device comprises a workbench, an upper detecting plate and a lower detecting plate, wherein a lower detecting table is movably arranged on the workbench; the workbench is provided with at least three groups of conveying assemblies for conveying PCBs; the multiple groups of conveying assemblies are divided to three parts and are equidistantly disposed on the workbench; and the workbench is further providedwith a limiting piece for limiting the PCB right above the lower detecting table. In use, two to-be-detected PCBs are taken to be placed between guiding rods side by side, when the PCB moves right above the lower detecting plate, the limiting piece limits the PCB, the PCB remains at a required position, a first cylinder then drives the lower detecting table to rise to detect the PCB, and thus, two PCBs can be detected at one time, and the effect of improving the detection efficiency can be achieved.

Description

technical field [0001] The invention relates to the technical field of electrical performance testing of semiconductor devices, in particular to a double-station electrical testing device. Background technique [0002] In the production of printed circuit boards, it is necessary to test its electrical properties through jigs. The PCB board test jig is a special fixture designed with the PCB board as a model for on-off testing of electrical properties. It has a single side Cutters and double-sided jigs. [0003] The Chinese patent with the authorized announcement number CN204389642U discloses a PCB board electrical testing fixture, including a base plate and a column arranged on the base plate. The base plate, the first fixing plate, and the second fixing plate are sequentially arranged on the column from bottom to top. and the first guide plate, the first guide plate is provided with a guide post, and the guide post is provided with a spring base plate, a second guide plate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 李梅车红波王攀峰周俊杰朴炫昌
Owner 信泰电子(西安)有限公司
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