V-I Diagram Sample Dataset Screening Method for Non-Intrusive Load Monitoring

A non-intrusive, load monitoring technology, applied in the field of data screening, can solve problems such as noise interference, V-I trajectory map sample data unavailable, etc., to achieve the effect of increasing the content rate, identification accuracy and identification efficiency

Active Publication Date: 2020-04-21
SOUTHWEST JIAOTONG UNIV
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Problems solved by technology

[0006] In view of the above-mentioned deficiencies in the prior art, the V-I diagram sample data set screening method for non-intrusive load monitoring provided by the present invention solves the problem that the actually measured stable operation data of household appliances has The problem that a large number of V-I trajectory sample data is unavailable due to noise interference

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[0045] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0046] like figure 1 As shown, a V-I diagram sample data set screening method for non-intrusive load monitoring, including the following steps:

[0047] S1. Select electrical equipment and use it as the equipment to be tested during non-intrusive load monitoring.

[0048] S2. When the device under test enters the steady-state working mode, collect current and voltage amplitude data of all the devices under test during oper...

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Abstract

The invention discloses a V-I diagram sample data set screening method for non-intrusive load monitoring. When the non-intrusive household appliance load monitoring is used as the background, it solves the problem of noise interference in the actually measured stable operation data of household appliances, which causes a large number of The problem that the sample data of the V-I trajectory map is unavailable; the method of the present invention optimizes the sample data set of the V-I feature map collected before the data set of the deep learning network is constructed, so as to improve the performance of the data set in characterizing the characteristics of key information The content rate improves the recognition accuracy and recognition efficiency of household appliances.

Description

technical field [0001] The invention belongs to the technical field of data screening, and in particular relates to a method for screening V-I diagram sample data sets for non-invasive load monitoring. Background technique [0002] With the development of society and economy, the proportion of energy consumption among residential users has increased year by year in recent years. The top priority is to improve energy utilization efficiency and effectively save energy, and the key measure to improve energy efficiency and save energy is to accurately understand the specific situation of energy consumption. Load monitoring can help residential users effectively save energy and reduce the Energy consumption, and cooperate with the power grid company in power management and power grid optimization, which is also in line with the requirements of the current conservation and environmental protection society. [0003] Traditional intrusive compliance monitoring (ILM) cannot meet the...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G06K9/62
Inventor 余志斌陈红宋吉聪
Owner SOUTHWEST JIAOTONG UNIV
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