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A linear analog circuit fault diagnosis method based on circular model parameters

A technology for simulating circuit faults and model parameters, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as heavy simulation workload, achieve the effect of improving training speed and fault diagnosis accuracy

Active Publication Date: 2019-06-28
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

Among them, training the neural network requires a large enough amount of data, so the pre-test simulation workload is relatively large

Method used

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  • A linear analog circuit fault diagnosis method based on circular model parameters
  • A linear analog circuit fault diagnosis method based on circular model parameters
  • A linear analog circuit fault diagnosis method based on circular model parameters

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Embodiment

[0039] In order to better illustrate the technical contents and invention points of the present invention, the theoretical derivation process of the present invention will be described first.

[0040] figure 1 is the analog circuit diagram. like figure 1 As shown, N represents a linear time-invariant circuit, which consists of an independent voltage source excitation. Indicates the output voltage phasor on the selected measuring point, and x is a passive component. According to the substitution theorem, the passive element x can be replaced by an independent voltage source with the same voltage across its terminals, resulting in an equivalent circuit. figure 2 Yes figure 1 Equivalent circuit diagram of the analog circuit shown. According to Thevenin's theorem, any active linear time-invariant port network can be equivalently replaced by a series branch of a voltage source and an impedance, so:

[0041]

[0042] in, Yes figure 2 Open-circuit voltage phasor of p...

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Abstract

The invention discloses a linear analog circuit fault diagnosis method based on circular model parameters. The method comprises steps of firstly, carrying out fuzzy group analysis on a linear analog circuit; obtaining a representative fault element corresponding to each fuzzy group; obtaining the label of each element corresponding to each representative fault element through circular model simulation; obtaining element parameters based on the label array, thereby obtaining an upper limit vector and a lower limit vector of the circular model parameter of each representative fault element, training the upper limit vector and the lower limit vector as boundary data to obtain an SVM-based multi-classification model, obtaining circular model parameters according to degradation data during fault diagnosis, and inputting the circular model parameters into the multi-classification model for diagnosis. By obtaining the boundary data, the training speed of the SVM-based multi-classification model can be effectively improved, and the fault diagnosis precision of the linear analog circuit is improved.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to a linear analog circuit fault diagnosis method based on circular model parameters. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some relatively well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-test ana...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 杨成林周秀云刘震
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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