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A p-type field effect transistor based on tungsten oxide and its preparation method

A field-effect transistor, tungsten oxide technology, applied in transistors, semiconductor/solid-state device manufacturing, electrical components, etc., can solve problems such as hindering the development of oxide semiconductor devices, inability to integrate devices, poor stability of ionic liquids, etc., to achieve process compatibility , the operation is completed, the effect of reducing the alignment requirements

Active Publication Date: 2022-02-11
JINAN UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the stability of ionic liquids is poor and the preparation process is difficult, and device integration cannot be carried out. Therefore, how to prepare tungsten oxide thin film transistors compatible with solid-state electronic devices has become a key obstacle hindering the development of oxide semiconductor devices.
On the other hand, the currently prepared tungsten trioxide-based field effect transistors are all N-type, and making a complete semiconductor circuit requires N-type and P-type field-effect devices, but the P-type field-effect devices based on tungsten oxide have not yet been realized.

Method used

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  • A p-type field effect transistor based on tungsten oxide and its preparation method
  • A p-type field effect transistor based on tungsten oxide and its preparation method
  • A p-type field effect transistor based on tungsten oxide and its preparation method

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Embodiment

[0029] figure 1 It is a schematic structural diagram of a P-type field effect transistor based on tungsten oxide in the present invention. A solid electrolyte sheet 02 is provided. The solid electrolyte sheet can be lithium ion ceramics. The insulating film 03 located on the surface of the solid electrolyte sheet 02 has a thickness of 10 to 10 50nm, the material of the insulating film 03 is Al 2 o 3 , SiO 2 、Si 3 N 4 , HfO 2 or ZrO 2 . The insulating film 03 is provided with a strip-shaped channel region, and the width of the strip-shaped channel region is less than 100 μm. The tungsten trioxide active layer 04 located on the insulating film and the channel region, the tungsten trioxide active layer 04 is an amorphous film with a thickness of 100-400nm. As well as the source and drain electrodes 05 located on the tungsten trioxide active layer 04 , a gate electrode is provided on the other surface of the solid electrolyte sheet 02 . The source-drain electrodes and the...

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Abstract

The invention relates to a P-type field effect transistor based on tungsten oxide and its preparation method. A solid electrolyte is used as a substrate, a mask plate is placed on the solid electrolyte substrate, and a device channel is reserved; then a layer of insulating film is deposited ; Then remove the mask plate, deposit tungsten trioxide thin film; then re-place the mask plate, evaporate the source and drain electrodes; finally evaporate and deposit the gate electrode on the back of the solid electrolyte to form a field effect device. In the present invention, tungsten trioxide is used as the active layer in the transistor, and Au is used as the source and drain electrodes. The device is prepared by vacuum thermal evaporation, and the process is simple. At the same time, the solid electrolyte is used as the gate medium. Coupling characteristics, when the gate electrode is far away from the channel region, it can still have a strong control effect on the conductivity of the channel, reducing the alignment requirements in the device manufacturing process, and obtaining a transistor that exhibits a P-type field effect modulation effect.

Description

technical field [0001] The invention relates to the technical field of transistors, in particular to a tungsten oxide-based P-type field effect transistor and a preparation method thereof. Background technique [0002] Metal oxide semiconductor materials have become the main research objects in the field of new flat panel displays due to their high mobility, high visible light transmittance and excellent electrical stability. Among many transition metal oxides, tungsten oxide has been intensively studied. Among them, tungsten trioxide is a wide bandgap semiconductor material with a band gap of 2.4eV to 3.5eV, because of its excellent electron transport properties, photoelectrochemical properties and optical properties. Catalytic properties, etc., especially in thin film form, can be used for advanced technological applications. The dielectric constant of the traditional silicon dioxide insulating layer is too small, so the carrier concentration of the tungsten trioxide film...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/786H01L21/34
Inventor 谢伟广余冰罗志卢月恒赖浩杰陈科球
Owner JINAN UNIVERSITY