Leaf area index inversion method and device
A technology of leaf area index and inversion, applied in measurement devices, neural learning methods, material analysis by optical means, etc., to achieve the effect of improving accuracy
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[0035] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0036] figure 1 The schematic diagram of the structure of the deep neural network model provided by the embodiment of the present application includes 6 network layers, specifically including: two convolutional layers, one pooling layer and three fully connected layers. Among them, the first convolutional layer of the two convolutional layers is connected to the second convolutional layer, the second convolutional layer is connected to the pooling layer, the pooling layer is connect...
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