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A realization method of square wave structured light illumination based on polarization

A technology of structured light illumination and implementation method, which is applied in the direction of material analysis, instruments, and measuring devices through optical means, which can solve the problems of low detection efficiency, shorten imaging time, realize sinusoidal structured light illumination, and improve defect detection efficiency Effect

Active Publication Date: 2021-11-12
TZTEK TECH
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Problems solved by technology

[0002] The existing glass defect detection method based on structured light lighting can effectively enhance various defects on the glass surface and interior. Simple, easy to configure, etc. However, because the structured light defect detection method needs to form four images of different phases of the sample, and in the case of low brightness of the structured light source and long response time, the detection efficiency of this method will be relatively low

Method used

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  • A realization method of square wave structured light illumination based on polarization
  • A realization method of square wave structured light illumination based on polarization
  • A realization method of square wave structured light illumination based on polarization

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Embodiment Construction

[0016] Such as figure 1 Shown, the present invention comprises the following steps:

[0017] S1. The liquid crystal display 8 is arranged at a certain distance d below the glass sample 7 to be inspected. At this time, the liquid crystal display 8 is in a defocused state, and the light intensity on the liquid crystal display 8 is distributed in black and white square wave stripes;

[0018] The liquid crystal display 8 realizes the adjustment of the display gray scale by controlling the phase difference between two orthogonal polarization directions: when the liquid crystal display 8 displays the minimum gray value, the outgoing light of the liquid crystal display 8 is perpendicular to the polarization direction of the polarizing film on its surface; When the liquid crystal display 8 displayed the maximum gray value, the outgoing light of the liquid crystal display 8 was parallel to the polarization direction of the polarizing film on its surface;

[0019] S2. A first camera mo...

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Abstract

The present invention provides a polarization-based method for implementing square-wave structured light illumination. By adjusting the distance d between the liquid crystal display and the glass sample to be inspected and the spatial period of the black and white square wave stripes displayed by the liquid crystal display, the first camera module and The spatial resolution of the second camera module to the position of the liquid crystal display is less than d / 2, and the simultaneous acquisition of dual-phase images can be realized, which shortens the imaging time by 1 / 2 compared with the existing structured light detection system, thereby improving The defect detection efficiency is improved, and the sinusoidal structured light illumination of the glass sample to be inspected is effectively realized when the liquid crystal display displays black and white stripes.

Description

technical field [0001] The invention relates to the technical field of structured light lighting, in particular to a method for realizing polarization-based square wave structured light lighting. Background technique [0002] The existing glass defect detection method based on structured light lighting can effectively enhance various defects on the glass surface and interior. Simple, easy to configure, etc. However, because the structured light defect detection method needs to form four images of different phases of the sample, and in the case of low brightness of the structured light source and long response time, the detection efficiency of this method will be relatively low . Contents of the invention [0003] In view of the above problems, the present invention provides a method for implementing polarization-based square-wave structured light illumination, which can not only effectively shorten the imaging time, but also improve the efficiency of defect detection. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/958G01N21/01
CPCG01N21/01G01N21/958
Inventor 骆聪袁春辉杨鹏
Owner TZTEK TECH
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