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Square-wave structure optical illuminating realization method based on polarization

A technology of structured light illumination and realization method, which is applied in the direction of material analysis, measuring device, instrument, etc. by optical means, can solve the problem of low detection efficiency, shorten imaging time, realize sinusoidal structured light illumination, and improve defect detection efficiency Effect

Active Publication Date: 2019-07-19
TZTEK TECH
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AI Technical Summary

Problems solved by technology

[0002] The existing glass defect detection method based on structured light lighting can effectively enhance various defects on the glass surface and interior. Simple, easy to configure, etc. However, because the structured light defect detection method needs to form four images of different phases of the sample, and in the case of low brightness of the structured light source and long response time, the detection efficiency of this method will be relatively low

Method used

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  • Square-wave structure optical illuminating realization method based on polarization
  • Square-wave structure optical illuminating realization method based on polarization
  • Square-wave structure optical illuminating realization method based on polarization

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Embodiment Construction

[0016] Such as figure 1 Shown, the present invention comprises the following steps:

[0017] S1. The liquid crystal display 8 is arranged at a certain distance d below the glass sample 7 to be inspected. At this time, the liquid crystal display 8 is in a defocused state, and the light intensity on the liquid crystal display 8 is distributed in black and white square wave stripes;

[0018] The liquid crystal display 8 realizes the adjustment of the display gray scale by controlling the phase difference between two orthogonal polarization directions: when the liquid crystal display 8 displays the minimum gray value, the outgoing light of the liquid crystal display 8 is perpendicular to the polarization direction of the polarizing film on its surface; When the liquid crystal display 8 displayed the maximum gray value, the outgoing light of the liquid crystal display 8 was parallel to the polarization direction of the polarizing film on its surface;

[0019] S2. A first camera mo...

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Abstract

The invention provides a square-wave structure optical illuminating realization method based on polarization. According to the square-wave structure optical illuminating realization method, by adjusting the distance d between a liquid-crystal display and a glass sample to be detected and the space period of black-white square-wave fringes displayed by the liquid-crystal display, spatial resolutions of a first camera module and a second camera module on the position where the liquid-crystal display is located are less than d / 2, and simultaneous collection of double-phase images can be achieved.Compared with an existing structural optical detection system, imaging time is shortened for 1 / 2, so that defect detection efficiency is improved, under the condition of displaying the black-white fringes by the liquid-crystal display, sine structure optical illumination of the glass sample to be detected is effectively achieved.

Description

technical field [0001] The invention relates to the technical field of structured light lighting, in particular to a method for realizing polarization-based square wave structured light lighting. Background technique [0002] The existing glass defect detection method based on structured light lighting can effectively enhance various defects on the glass surface and interior. Simple, easy to configure, etc. However, because the structured light defect detection method needs to form four images of different phases of the sample, and in the case of low brightness of the structured light source and long response time, the detection efficiency of this method will be relatively low . Contents of the invention [0003] In view of the above problems, the present invention provides a method for implementing polarization-based square-wave structured light illumination, which can not only effectively shorten the imaging time, but also improve the efficiency of defect detection. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958G01N21/01
CPCG01N21/01G01N21/958
Inventor 骆聪袁春辉杨鹏
Owner TZTEK TECH
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