Method and device for adjusting test parameters and medium

Abstract

The embodiment of the invention discloses a method and device for adjusting test parameters and a computer readable storage medium, and the method comprises the steps: setting current parameters of 3Dsweep frequency load according to a pre-defined current value; and performing 3D frequency sweeping and loading on the memory to be tested to obtain a pull-load current. The value range of the current is greatly reduced through the pull-load current obtained after 3D frequency sweeping, the pull-load current serves as a test parameter, the test time can be saved, and the test accuracy is improved. The more accurate the rise time is, the more accurate the test result is. the rise time of the signal generator is determined according to the corresponding relationship between the voltage and thepull-load current and the voltage conversion rate. The pull-load current obtained through 3D frequency sweeping and the rising time obtained through calculation serve as test parameters of the signalgenerator, the test parameters better conform to the actual test range of the to-be-tested memory, and therefore the signal generator conducts pull-load test on the to-be-tested memory according to the test parameters, and the obtained test result is more accurate.

Description

technical field [0001] The invention relates to the technical field of board card testing, in particular to a method, device and computer-readable storage medium for adjusting test parameters. Background technique [0002] With the development of cloud computing applications, informatization has gradually covered all fields of society. People's daily work and life are more and more communicated through the network, and the amount of network data is also increasing. In order to meet the ever-increasing demand for information services, the functions of the server are becoming more and more abundant. In order to support more and more functions, server motherboards are becoming increasingly complex. [0003] Due to the particularity of the work of the server motherboard, the requirements for memory are getting higher and higher, and the fourth-generation double-rate synchronous dynamic random access memory (Double Date Rate SDRAM, DDR4) is generally used. In Intel's voltage c...

AI Technical Summary

Problems solved by technology

[0004] The parameters of the signal generator are all based on the settings defined in the Intel test report. The frequency, duty cycle, and load current values ​​in the report cover a wide range, which wastes a lot of time and cannot accurately and effectively find the worst value.

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