Dual-energy X-ray grating interferometric imaging system and method

Abstract

The invention provides a dual-energy X-ray grating interferometric imaging system and method. The dual-energy X-ray grating interferometric imaging system is provided with a light source, a dual-energy phase grating and an X-ray detector, wherein the light source has a certain coherence performance and can generate two scheduled X-rays with different energy; the dual-energy phase grating can generate the same phase shifting on the two scheduled X-rays with different energy so as to generate the same periodic vertical strips at the same position behind the dual-energy phase grating; a resolution of the X-ray detector is superior to a period of the vertical strips; the light source is parallel light; and a to-be-detected sample, the dual-energy phase grating and the detector are sequentiallyconfigured from an incident direction of the X-rays of the light sources. According to the invention, for the problem, the invention aims to provide the dual-energy X-ray grating interferometric imaging system and method which can implement dual-energy grating interferometric imaging, so that information of linear attenuation factors, phase shifting factors, scattering factors and the like of thesample under two types of energy can be obtained, and substance identification, defect diagnosis and the like can be effectively carried out.

Description

technical field [0001] The invention relates to a dual-energy X-ray grating interference imaging system and method. Background technique [0002] As grating interference imaging technology, the commonly used technology at present is to use X-ray light source and phase grating to generate regular vertical fringe pattern (ie, Talbot fringe), and to increase the distortion, intensity attenuation, blurring and other information of the pattern before and after the sample is added to the optical path. , to realize the imaging and information separation of the absorption contrast, phase contrast and dark field contrast of the sample. [0003] In the case of plane waves without considering the amplification effect, if the phase shift of the phase grating to the designed X-ray is π, the period of the vertical stripes is 1 / 2 of the period of the phase grating, if the phase shift is other rational fraction times When π, the period of the vertical stripes is consistent with the period ...

AI Technical Summary

Problems solved by technology

Grating interference imaging is different from traditional X-ray imaging that can achieve dual-energy imaging by changing the energy spectrum distribution of the light source. Although it is also X-ray imaging, it is far less direct than traditional X-ray imaging to achieve dual-energy imaging.

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