Pulling/pressing head replacement device and operation method for mechanical tester

Abstract

The invention discloses a pull / press head replacement device used for a mechanical tester and an operation method. The device comprises a base with a limiting sliding rail, a dual-axis (X and Z) movement platform, a metal sheet with a groove formed in one end, a manual screw, a press head fixing press sheet, a single-axis (Z) movement platform, a press head demounting and mounting tool, a demounting and mounting tool limiting device, multiple fixed screws, multiple pieces of carbon glue and multiple springs. The single-axis movement platform and the dual-axis movement platform can be placed inthe base with the limiting sliding rail to move stably. The manual screw, the press head fixing press sheet and the metal sheet are located on the upper surface of the dual-axis movement platform. The demounting and mounting tool and the limiting device are located on the upper surface of the single-axis movement platform. Replacement of a pull / press head of the in-situ quantitative nano mechanical tester can be achieved safely and efficiently, the risk of damage of the pull / press head and a force / displacement sensor is greatly reduced, the device is easy to operate, and operation is simple and convenient.

Description

technical field [0001] The invention belongs to the field of in-situ quantitative nanomechanical tester accessories, and in particular relates to a pull / press head replacement device and an operation method for a mechanical tester. Background technique [0002] An electron microscope refers to a microscope that uses electrons to display the interior or surface of an object, and is generally divided into a transmission electron microscope and a scanning electron microscope. Transmission electron microscopy is widely used in many research fields such as material science and biotechnology because of its ultra-high resolution (up to atomic level). In-situ (in-situ) transmission electron microscopy technology refers to the external excitation, such as force, heat, light, electricity, etc. An advanced technology for real-time observation and recording of the dynamic changes in the shape, structure and composition of samples under external stimuli through CCD image sensors. [00...

AI Technical Summary

Problems solved by technology

Replacing the indenter with a hand-held method requires extremely high stability of the human hand, and it is easy to cause damage to the indenter during the replacement process, and this method lacks universality

At the same time, since the indenter is directly connected to the sensor, when the indenter is replaced by hand, the natural shaking of the hand can easily cause damage to the sensor through the indenter, and the sensor is the core component of the in-situ quantitative mechanical testing device. , once damaged, the loss can reach tens of thousands or even more than one hundred thousand yuan

Moreover, once the sensor is damaged, it can be returned to the factory for repairs, ranging from a few months to as many as one or two years, and the time cost is high.

[0006] To sum up, the original in-situ quantitative nanomechanical tester's pull / press head replacement method seriously affects and limits the daily use and mechanical testing methods of pull / press heads due to design defects and instability of hand-held operation. The development of diversity and potential risks to the safety of force / displacement sensors

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