Radiation effect test board, system, method and device for obtaining length of connecting wire
A radiation effect and connecting wire technology, which is applied in the field of reliability of electronic devices, can solve problems such as the inability to accurately obtain the single event effect test results of devices, and achieve the effect of improving accuracy
Active Publication Date: 2021-05-11
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology
[0005] Based on this, it is necessary to provide a radiation effect test board, a system, a method and a device for obtaining the length of a connecting line for the problem that the traditional technology cannot accurately obtain the test results of the single event effect of the device
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[0043] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.
[0044] It should be noted that when a component is considered to be "connected" to another component, it may be directly connected to and integrated with the other component, or there may be intervening components at the same time. The terms "mounted", "one end", "the other end" and similar expressions are used herein for the purpose of description only.
[0045] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly un...
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The present application relates to a radiation effect test board, a system, a method and a device for obtaining the length of a connection line, the radiation effect test board includes a daughter board, a motherboard and a connection wire; the connection wire is connected between the daughter board and the mother board; The line is used to separate the daughter board and the mother board at a distance equal to the length of the connecting line during the radiation effect test; where the length of the connecting line is based on the effective cross-sectional area of the mother board relative to the neutron beam during the radiation effect test , the neutron flux at the bullseye of the neutron source, the irradiation duration of the mother board under the neutron beam irradiation and the total neutron flux received by the mother board; The board is separated from the motherboard, which avoids the interference of the radiation effect test of the device under test caused by the neutron beam irradiating the sensitive device on the motherboard during the radiation effect test of the device under test, and further improves the In order to test the accuracy of the radiation effect of the device under test.
Description
technical field [0001] The present application relates to the technical field of reliability of electronic devices, in particular to a radiation effect test board, a system, a method and a device for obtaining the length of a connecting line. Background technique [0002] Atmospheric space has a complex radiation environment composed of a large number of radiation particles, in which radiation particles are formed by the galactic cosmic rays and solar cosmic rays ejected by the sun entering the earth's atmosphere and interacting with nitrogen and oxygen in the atmosphere, It mainly includes neutrons, protons, electrons, gamma rays, pions, muons, etc. When neutrons in radiation particles are incident on aviation and ground electronic systems, they can cause single event effects, which threaten the safe operation of electronic equipment. [0003] According to the JESD89A international standard, there are two overall evaluation methods for the real-time error rate of semicondu...
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IPC IPC(8): G01R31/00
CPCG01R31/001G01R31/003
Inventor 张战刚黄云雷志锋彭超何玉娟肖庆中
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST