Measuring system for elastic modulus of materials using interferometry to support beams
A material elastic modulus and measurement system technology, which is applied in the measurement of phase influence characteristics, measurement devices, and analysis materials, etc., can solve problems such as difficulty in real-time measurement, and achieve the effect of improving step precision, simple structure, and improving measurement level.
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[0017] Such as figure 1 As shown, the material elastic modulus measurement system using the interferometry support beam 12 disclosed in this embodiment is mainly composed of an optical measurement module 1 , a measurement demodulation module 2 , a data calculation module 3 , and a control processing module 4 .
[0018] The optical measurement module 1 includes a collimated light source 5, an optical measurement unit composed of related optical elements, a photoelectric conversion front-end circuit, and a data acquisition circuit. Through the optical measurement module 1, the displacement of the elastic deformation of the material of the support beam 12 can be converted into Electrical signals for digital processing. The measurement demodulation module 2 is used to perform logical comparison and arithmetic processing on the interferometric electrical signals acquired by the optical measurement module 1, calculate the basic displacement measurement data for measurement control a...
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