Method and device for discriminating soft errors of tested device and computer equipment

A device under test, soft error technology, applied in the direction of measuring devices, instruments, measuring electricity, etc., can solve the problems affecting the accuracy of test results, confusion of test results, etc., to achieve the effect of high practicability, simple and effective screening

Inactive Publication Date: 2019-09-10
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

However, when carrying out the non-accelerated real-time measurement test of atmospheric neutron single event effects, the entire test system is exposed to the natural radiation environment. Atmospheric neutrons may be in the device under test or other sensitive devices on the test board (such as FPGA , memory, etc.), test equipment, etc. cause single event effects, resulting in confusion of test results and affecting the accuracy of test results

Method used

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  • Method and device for discriminating soft errors of tested device and computer equipment
  • Method and device for discriminating soft errors of tested device and computer equipment
  • Method and device for discriminating soft errors of tested device and computer equipment

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Embodiment Construction

[0024] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0025] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...

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Abstract

The invention provides a method and device for discriminating software errors of a tested device and computer equipment. Under the condition of the occurrence of the soft error, according to the method, device abnormal recovery operation is carried out on the tested device, soft error detection is carried out again, and whether the soft error comes from the tested device is determined according toa detection result, thereby distinguishing the radiation effect generated in the tested device and other equipment and obtaining the soft error rate of the tested device. The method for discriminating software errors of the tested device is simple and easy to operate.

Description

technical field [0001] The invention relates to the field of reliability of electronic devices, in particular to a soft error screening method, device and computer equipment of a device under test. Background technique [0002] Soft errors are random, temporary changes of state or transients in electronic devices caused by the interaction between radiation particles and device materials. There are two main sources of soft errors in electronic devices operating on the ground and in the atmosphere: 1) decay of radioactive impurities in packaging materials; 2) atmospheric neutrons. The soft error rate of electronic devices determines the failure rate of the corresponding electronic system, which is very important for applications with high reliability requirements such as aviation, communication, finance, and medical treatment. As semiconductor process nodes continue to shrink, the impact of soft errors will become increasingly severe. In view of this, it is of great signific...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 张战刚雷志锋彭超何玉娟肖庆中黄云恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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