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Self-positioning method for complex surface deflection measurement based on virtual marker points

A technology of complex curved surfaces and marker points, which is applied in the field of optical engineering, can solve problems such as high cost and cumbersome calibration work, and achieve the effect of improving efficiency and versatility, and avoiding position calibration work

Active Publication Date: 2020-11-20
FUDAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

A common method is to use a three-coordinate measuring machine or a laser tracker to calibrate the coordinate system of the workbench and the workpiece to be measured. This method is not only cumbersome and difficult to calibrate, but also expensive

Method used

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  • Self-positioning method for complex surface deflection measurement based on virtual marker points
  • Self-positioning method for complex surface deflection measurement based on virtual marker points
  • Self-positioning method for complex surface deflection measurement based on virtual marker points

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Embodiment 1

[0038] Embodiment 1: Utilize altimeter to measure the height h of the center of revolution (virtual marker point) of a spherical mirror with a diameter of 70 mm and a radius of 1000 mm, and the measurement result is 12 mm; place the spherical mirror horizontally on any position of the measurement platform, and perform deflection measurement ;According to the circle attribute of the side profile, the center of gravity of the measurement area is extracted on the image, which is the actual measurement mark point. According to the system calibration parameters, the spatial straight line expression of the reflected light of the actual measurement mark point can be obtained; the height of the center of rotation is taken as the actual measurement The height Z of the marker point is substituted into the above linear expression, and the X and Y coordinates of the measured marker point are calculated as 1.63mm and 0.26mm respectively; figure 1 As shown, there is a certain offset between ...

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Abstract

The invention belongs to the technical field of precision measurement, and specifically relates to a complex curved surface deflection measurement self-positioning method based on a virtual marker point. The complex curved surface deflection measurement self-positioning method comprises the steps of: regarding a center point of an aperture of a measured component as the virtual marker point; detecting a height coordinate of the center point at first, and calculating world coordinates of an actually measured marker point; calculating projection screen pixel coordinates corresponding to the actually measured marker point and a normal vector of the actually measured marker point according to phase information of a deflection measurement image; iteratively estimating a radius of a sphere and corresponding sphere center coordinates by utilizing a reverse tracing method; and finally acquiring coordinates of a measuring point, so as to determine transverse coordinates of the surface shape of a measured workpiece. The complex curved surface deflection measurement self-positioning method can effectively calculate the best fit spherical surface parameters of the measured surface shape, provides reliable initial measurement coordinates, avoids the cumbersome and difficult position calibration in the traditional method, and has important significance for improving the efficiency and universality of the deflection measurement.

Description

technical field [0001] The invention belongs to the technical field of optical engineering, in particular to a complex curved surface deflection measurement self-positioning method. Background technique [0002] High-quality optical components are increasingly used in a variety of fields, including precision engineering, aerospace, and more. The surface shape of an optical element is crucial to the realization of its imaging function. For smooth mirrors, phase measurement deflectometry has many excellent properties. Among them, monocular deflectometry has a simple measurement system, a large dynamic range, and strong anti-interference ability, and can be used for the measurement of complex curved surfaces. It has received extensive attention in recent years. The principle is to generate regular stripes on the display, and the stripes will be deformed after being reflected by the measured surface. The deformation pattern is taken by a CCD camera, and the coordinates of the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 张祥朝牛振岐徐敏
Owner FUDAN UNIV