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Film capacitor parameter testing method

A film capacitor, parameter testing technology, applied in capacitance measurement, electrical digital data processing, instruments, etc., can solve the problems of capacitor parameter aging, circuit failure, capacitor performance degradation, etc.

Active Publication Date: 2019-09-27
CENT SOUTH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Over time, capacitor parameters will also gradually age, resulting in capacitor performance degradation and even circuit failure

Method used

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  • Film capacitor parameter testing method
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Embodiment Construction

[0054] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0055] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

[0056] Capacitors play an important role in power converters. In DC-AC conversion, a support capacitor is usually connected in parallel with the DC bus to absorb the pulsating current on the DC side, thereby avoiding high-amplitude pulsating voltage at the impedance e...

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Abstract

The invention discloses a thin film capacitor parameter test method. The method comprises the following steps: establishing a state identification model of a thin film capacitor; obtaining the voltage and the current of the thin film capacitor; and substituting the voltage and the current into the state identification model to obtain and output the state identification parameters. By means of the method, the capacitance C and the equivalent series resistance ESR of the thin film capacitor can be accurately measured, the state of the thin film capacitor is monitored in real time, faults are judged in time, and the capacitor is replaced.

Description

technical field [0001] The invention relates to capacitor state identification, in particular to a method for testing film capacitor parameters. Background technique [0002] Capacitors play an important role in power converters. In DC-AC conversion, a support capacitor is usually connected in parallel with the DC bus to absorb the pulsating current on the DC side, thereby avoiding high-amplitude pulsating voltage at the impedance end of the DC side, effectively controlling the fluctuation range of the ripple voltage, and reducing the The impact of instantaneous overvoltage on the DC side on the opening of switching devices. The performance of a capacitor is closely related to its own parameters. Over time, capacitor parameters will also gradually age, which can lead to capacitor degradation or even circuit failure. In many important applications, it is necessary to monitor the state of the capacitor in real time so that the capacitor can be replaced in time. At present,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01R31/00G01R27/08G01R27/26
CPCG01R31/00G01R27/08G01R27/2605G06F30/367G06F30/30
Inventor 于天剑伍珣成庶李凯迪
Owner CENT SOUTH UNIV
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