Device for structured light projection ray machine and assembling method thereof

Abstract

The invention discloses a device for a structured light projection ray machine and an assembling method thereof. The device comprises a laser, a fixed seat, a shaping lens, a micro-galvanometer module, a flexible printed circuit FPC, a galvanometer base and window glass. The laser is fixedly mounted below the fixed seat. The shaping lens and the micro-galvanometer module are fixed on the galvanometer base. The flexible printed circuit FPC is connected with the laser and the micro-galvanometer module and supplies power to the laser and the micro-galvanometer module. The window glass is bonded and fixed onto the surface of the fixed seat. The optical axes of the laser, the shaping lens and the micro-galvanometer module coincide. Light obtained after a light beam of the laser passes through the shaping lens is a straight line and parallel to the rotating shaft of the micro-galvanometer module, and is at the same horizontal height. The device is an afocal system with a large depth of field. The thickness of light can be basically kept unchanged at different depths of the surface of an object. The device can be used in various three-dimensional information detection environments such asindustrial three-dimensional structure detection and face recognition, and is exquisite, small and low in power consumption.

Description

technical field [0001] The invention relates to a device for a structured light projection light machine, which belongs to the technical field of micro-electromechanical systems. Background technique [0002] At present, sinusoidal stripes or equidistant thin stripes are commonly used as light sources in 3D detection, and the scanning projection function of the MEMS galvanometer is used to realize structured light pattern scanning. However, for objects with different depths on the surface, the thickness of the light is difficult to keep constant, which is not very good. The measured three-dimensional information cannot meet the needs and requirements of three-dimensional detection. Therefore, the company designed a device that can meet the needs and requirements of three-dimensional detection to meet the needs of various three-dimensional information detection environments. Contents of the invention [0003] In view of the above-mentioned technical problems, the object of ...

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Problems solved by technology

[0002] At present, sinusoidal stripes or equidistant thin stripes are commonly used as light sources in 3D detection, and the scanning projection function of the MEMS galvanometer is used to realize structured light pattern scanning. However, for objects with different depths on the surface, the thickness of the light is difficult to keep constant, which is not very good. The measured three-dimensional information cannot meet the needs and requirements of three-dimensional detection. Therefore, the company designed a device that can meet the needs and requirements of three-dimensional detection to meet the requirements of various three-dimensional information detection environments.

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