Unlock instant, AI-driven research and patent intelligence for your innovation.

Flaw detection machine teaching aid

A flaw detection machine and teaching aid technology, applied in the field of flaw detection, can solve problems such as endangering learning and user health, endangering life, etc., to achieve the effect of not harming human health and reducing ionizing radiation

Pending Publication Date: 2019-11-19
ZHONGSHAN POLYTECHNIC
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The working frequency of the high-voltage package of the existing ray flaw detector is generally 25 kHz to 40 kHz, and the output power of the secondary side of the high-voltage package is also as high as 50 kV, which will generate high-frequency ionizing radiation during flaw detection; if the operator Lack of experience may endanger learning and the health of users, and may even endanger life. Therefore, it is very necessary for us to develop a flaw detector that will not endanger personal safety.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Flaw detection machine teaching aid
  • Flaw detection machine teaching aid
  • Flaw detection machine teaching aid

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0022] as attached Figure 1-8 As shown, a teaching aid for a flaw detector includes a housing 1, and the housing 1 is provided with an accommodating cavity 11, and the accommodating cavity 11 is provided with an upper cavity 12 and a lower cavity. The placement plate 14 of the body 13, the test block 90 is placed on the placement plate 14, the placement plate 14 can be made of transparent materials such as glass, so that the light can pass through. The lower cavity 13 is provided with an imaging plate 15 parallel to the placement plate 14. Below the imaging plate 15, there is a horn-shaped annular connector 16 with a large head and a small tail. The head of part 16 is provided with upper bell mouth 17, and afterbody is provided with lower bell mouth 18, and the top surface of described upper bell mouth 17 is connected with the lower end surfac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention creatively discloses a flaw detection machine teaching aid. The flaw detection machine teaching aid comprises a shell, wherein a containing cavity is formed in the shell; the containingcavity is internally provided with a placing plate for separating the containing cavity into an upper cavity and a lower cavity; a test block is arranged on the placing plate, and an imaging plate isarranged in the lower cavity; an annular connecting piece is arranged below the imaging plate; an upper horn mouth is formed in the head of the annular connecting piece, and a lower horn mouth is formed in the tail part; the top end face of the upper horn mouth is connected with the lower end face of the imaging plate; a camera is arranged at the opening of the lower horn mouth; an adjustment device used for adjusting a light source to move to irradiate the test block is arranged in the upper cavity, and the adjustment device comprises a longitudinal adjustment mechanism and a transverse adjustment mechanism. The light source is an LED lamp, and the LED light source is used for replacing a high-voltage packet in the prior art; and the LED light source is used for simulating visible light ray flaw detection, the LED light source can greatly reduce ionizing radiation, and hurt to the health of a human body can be avoided.

Description

【Technical field】 [0001] The invention relates to the field of flaw detection, in particular to a flaw detection machine teaching aid. 【Background technique】 [0002] The working frequency of the high-voltage package of the existing ray flaw detector is generally 25 kHz to 40 kHz, and the output power of the secondary side of the high-voltage package is also as high as 50 kV, which will generate high-frequency ionizing radiation during flaw detection; if the operator Lack of experience may endanger learning and the health of users, and may even endanger life. Therefore, it is very necessary for us to develop a flaw detector that will not endanger personal safety. 【Content of invention】 [0003] In order to solve the above problems, the present invention provides a flaw detector teaching aid that uses LED lamps instead of high-voltage packs, which uses visible light to simulate ray flaw detection without endangering human health. [0004] In order to achieve the above obje...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G09B25/02
CPCG09B25/02
Inventor 富阳
Owner ZHONGSHAN POLYTECHNIC