A Sample Stretching Device for In-Situ Infrared Spectroscopy Analysis

A technology of infrared spectrum analysis and stretching device, which is applied in the field of sample stretching device, can solve the problems of cumbersome operation, low efficiency, repeated replacement of biaxially stretched film, etc., and achieve the effect of simplifying the detection process, improving work efficiency and being easy to implement

Active Publication Date: 2022-03-04
GUANGDONG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a sample stretching device for in-situ infrared spectrum analysis in order to solve the problems of repeated sample replacement, cumbersome operation and low efficiency in the testing process of existing equipment for biaxially stretched films

Method used

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  • A Sample Stretching Device for In-Situ Infrared Spectroscopy Analysis
  • A Sample Stretching Device for In-Situ Infrared Spectroscopy Analysis
  • A Sample Stretching Device for In-Situ Infrared Spectroscopy Analysis

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Experimental program
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Effect test

Embodiment 1

[0030] A sample stretching device for in situ infrared spectroscopic analysis, such as Figure 1~4 As shown, it includes: a housing 1, the housing 1 is provided with a cavity, and the housing 1 is also provided with a sample placement module, an extrusion module, and a temperature control module 11;

[0031] The housing 1 is provided with a first through hole 12 penetrating through the housing 1; in this embodiment 1, there are two first through holes 12, which are arranged on the front and rear sides of the housing 1 respectively. When performing infrared spectrum analysis, the infrared light emitted by the infrared spectrum analyzer can be irradiated to the sample to be tested through the first through hole 12 on the front side of the housing 1 and transmitted through the first through hole 12 on the rear side of the housing 1 go out;

[0032] The sample placement module is used to install and fix the sample to be tested inside the housing 1, and the sample is installed and...

Embodiment 2

[0038] In this embodiment 2, the sample stretching device provided in the above embodiment 1 is applied to an in-situ infrared spectrum analysis system, the system includes an infrared spectrum analyzer, and the sample placement module on the housing 1 and the hollow compact 6 are set In the sample chamber of the infrared spectrum analyzer, other components of the sample stretching device are arranged outside the sample chamber of the infrared spectrum analyzer.

[0039] When testing, such as Figure 6 As shown, the light emitted by the infrared light source in the spectrum analyzer is collected and reflected by the elliptical reflector, and the reflected light reaches the collimating mirror after passing through the grating, and the parallel reflected light reflected from the collimating mirror is directed to the interferometer (in this embodiment 2 The interferometer includes a beam splitter, a fixed mirror and a moving mirror), the parallel interference light from the inter...

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Abstract

The invention discloses a sample stretching device for in-situ infrared spectrum analysis, which comprises a casing, a cavity is arranged inside the casing, and a sample placement module and an extrusion module are also arranged on the casing; the casing The body is provided with a first through hole through the housing; the sample placement module is used to install and fix the sample to be tested inside the housing, and the sample is installed and fixed to face the housing. a first through hole; the extruding module is used to extrude the sample installed and fixed on the sample placing module. The device of the present invention can realize the biaxial stretching simulation of the sample film and the in-situ infrared measurement at the same time, without repeatedly removing and reinstalling the sample from the extrusion equipment, simplifying the detection process of obtaining spectral data, and improving the work of sample detection efficiency. The device of the invention has simple structure and is easy to realize.

Description

technical field [0001] The invention relates to the technical field of infrared spectrum analysis, in particular to a sample stretching device for in-situ infrared spectrum analysis. Background technique [0002] According to different manufacturing processes, the preparation of films is divided into uniaxial stretching and biaxial stretching. Among them, the mechanical properties of uniaxially stretched films in the vertical stretching direction will be relatively poor. Thin neck phenomenon, the film exhibits anisotropy. The biaxially stretched film has average performance in all directions, that is, isotropy. The infrared spectroscopic analysis instrument can test the characteristic groups in the sample, and then determine the structure and type of the film sample. [0003] However, in order to obtain the dynamic change process of the sample under different stretching degrees, the current testing equipment needs to perform a series of stretching on the film sample on the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3563G01N21/01G01N3/08
CPCG01N21/3563G01N21/01G01N3/08G01N2021/3572
Inventor 袁子丹雷彩红徐睿杰
Owner GUANGDONG UNIV OF TECH
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