Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Laser corner reflector aperture optimization method for satellite-borne laser altimeter on-orbit calibration

A laser angle reflector and laser altimeter technology, applied in instruments, radio wave measurement systems, etc., can solve the problems of reflected pulse echo aliasing, reflected pulse echo saturation, and inability to identify, to prevent missed detection. or the effect of saturation

Active Publication Date: 2019-12-10
WUHAN UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The CCR obtained by this method may saturate the reflected pulse echo or alias with the ground reflected pulse echo and cannot be identified, so it can only be applied to pulsed spaceborne laser altimetry with certain parameters Meter distance calibration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Laser corner reflector aperture optimization method for satellite-borne laser altimeter on-orbit calibration
  • Laser corner reflector aperture optimization method for satellite-borne laser altimeter on-orbit calibration
  • Laser corner reflector aperture optimization method for satellite-borne laser altimeter on-orbit calibration

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051] The technical solutions of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings.

[0052] see Figure 4 , a method for optimizing the aperture of a laser corner reflector for on-orbit calibration of a spaceborne laser altimeter proposed by an embodiment of the present invention includes the following steps:

[0053] Step 1. Enter the initial parameters related to laser corner reflector aperture setting.

[0054] During specific implementation, relevant parameters can be input in advance, and the parameters input in the embodiment include:

[0055] Satellite parameters: satellite orbit altitude and satellite flight speed;

[0056] Spaceborne laser altimeter launch system parameters: working wavelength, single pulse energy, root mean square pulse width, laser pointing angle and divergence angle, and transmittance of the launch system of the spaceborne laser altimeter;

[0057] The r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a laser corner reflector aperture optimization method for satellite-borne laser altimeter on-orbit calibration, which is characterized by comprising the following steps: firstly, obtaining a satellite speed difference angle by utilizing satellite orbit height and satellite flight speed; setting a search range of the CCR aperture based on the satellite speed difference angleand the emitted laser wavelength; calculating amplitudes, time gravity centers and root-mean-square pulse widths of the CCR reflection pulse echo and the ground reflection pulse echo according to initial parameters during calibration of the satellite-borne laser altimeter; calculating the Bhattacharyya distance between the ground reflection pulse echo and the CCR reflection pulse echo; and finally, according to the detection range of a receiving system and the threshold condition of the Bhattacharyya distance, optimizing and searching to obtain the optimal aperture of the CCR. The method not only can effectively prevent the CCR reflection pulse echo from missing detection or saturation, but also can ensure that the CCR reflection pulse echo and the ground reflection pulse echo are not aliasing, so that the method can be suitable for distance calibration of all pulse-type satellite-borne laser altimeters.

Description

technical field [0001] The invention belongs to the field of laser radar calibration, and in particular relates to a method for optimizing the aperture of a laser corner reflector used for on-orbit calibration of a spaceborne laser altimeter, and is suitable for calibration of the geometric distance of a spaceborne laser altimeter. Background technique [0002] The pulsed spaceborne laser altimeter is a new type of earth observation equipment. The laser pulses emitted by it are collected by the receiving system and converted into pulse echoes after being transmitted by the atmosphere and scattered or reflected by ground targets. By measuring the time interval between transmitting the pulse signal and receiving the pulse echo signal, the distance value between the satellite and the ground target can be calculated. Affected by factors such as the timing accuracy of the spaceborne laser altimeter timing system, the correction accuracy of atmospheric delay, the broadening of the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/497G01S7/48
CPCG01S7/497G01S7/4802
Inventor 周辉李松罗敏马跃田昕李泓成
Owner WUHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com