Langmuir probe, Langmuir probe detection system and detection method

Abstract

The invention provides a Langmuir probe, a Langmuir probe detection system and a detection method, and relates to the electric thruster vacuum plume parameter detection equipment technology field. A probe, a limiting shell, a sliding inner shell and a rotating shaft are included. A first end of the probe is stretched out of the first end of the sliding inner shell, and a second end is connected with a rotating shaft. The limiting shell is fixed, the first end of the sliding inner shell is stretched out of the first end of the limiting shell, and the limiting shell limits the sliding inner shell to rotate around an axial direction. An inner side wall of the sliding inner shell is in threaded connection with an outer side wall of the rotating shaft. The rotating shaft is rotated to drive thesliding inner shell to slide relative to the limiting shell along the axial direction. In the invention, a length of the probe can be changed without moving the probe, accuracy of a position of the probe is ensured, space precision is ensured, an interference is not brought to a flow field, and measurement accuracy is improved.

Description

technical field [0001] The invention relates to the technical field of electric thruster vacuum plume parameter detection equipment, in particular to a Langmuir probe, a Langmuir probe detection system and a detection method. Background technique [0002] Electric thrusters such as ion thrusters and Hall thrusters are widely used in spacecraft attitude and orbit control due to their advantages of high specific impulse, long life and small system mass. Accurately obtaining electric thruster vacuum plume parameters is crucial for evaluating the performance of electric thrusters and spacecraft. Langmuir probes are usually used to detect the electron temperature and electron number density of the electric thruster vacuum plume flow field. [0003] At present, when the electron temperature and electron number density are detected by the Langmuir probe, it is sometimes necessary to change the length of the Langmuir probe protruding from the insulating shell (that is, the length of...

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Problems solved by technology

[0003] At present, when the electron temperature and electron number density are detected by the Langmuir probe, it is sometimes necessary to change the length of the Langmuir probe protruding from the insulating shell (that is, the length of the probe exposed to the plasma environment). When changing the protruding length of the probe, it is necessary to ensure the accuracy of the probe position at the same time, so as to avoid interference to the flow field and affect the measurement accuracy

However, in the existing telescopic Langmuir probe, when the extension length of the probe is changed by the telescopic probe, the position of the probe will be moved at the same time, which will cause great disturbance to the flow field and affect the measurement accuracy

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