Mura detection method and device based on variable coefficient
A coefficient of variation, to-be-detected technology, applied in the field of image processing, can solve the problems of low accuracy and poor effect of Mura defect detection
Inactive Publication Date: 2019-12-13
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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[0004] In view of this, the embodiment of the present invention discloses a mura defect detection method and device based on the number of mutations, which solves the problem of low accuracy and poor effect of mura defect detection in the prior art
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[0057] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0058] refer to figure 1 , which shows a schematic flow chart of a method for detecting mura defects based on a coefficient of variation provided by an embodiment of the present invention. In this embodiment, the method includes:
[0059] S101: Acquire an image to be detected;
[0060] In this embodiment, the image to be detected is a captured screen image, such as figure 2 As shown, the screen image captured therein can be a color image.
[0061]The acqui...
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The embodiment of the invention discloses a Mura defect detection method based on a variable coefficient. The Mura defect detection method comprises the following steps: acquiring a to-be-detected image containing a display screen; performing gray processing on the to-be-detected image to obtain a gray image of the to-be-detected image; performing edge processing on the grayscale image to obtain an edge image of the grayscale image; extracting a screen effective area based on the edge image; calculating a variable coefficient of a to-be-processed image according to a screen effective area andthe grayscale image; and determining the position of the Mura defect in the to-be-detected image based on the variable coefficient. Therefore, according to the embodiment of the invention, by extracting the effective area, the influence of the ineffective area on the detection result is eliminated, the calculation amount is reduced, and the calculation time is shortened. In addition, the variationcoefficient insensitive to the measurement scale is adopted to detect the Mura defect, and the universality of the detection method is enhanced. In addition, the method has a good detection effect onlow-contrast Mura defects.
Description
technical field [0001] The invention relates to the field of image processing, in particular to a mura detection method and device based on a coefficient of variation. Background technique [0002] In the process of manufacturing display devices such as LEDs and LCDs, local brightness unevenness of the display may be caused by process defects and other reasons. The traces caused by uneven brightness are called mura defects. [0003] Moreover, in the current production process of all display devices, the detection of mura defects is an essential key technology. However, the accuracy of mura defect detection in the prior art is low, and the effect is poor. Contents of the invention [0004] In view of this, the embodiment of the present invention discloses a mura defect detection method and device based on mutation times, which solves the problem of low accuracy and poor effect of mura defect detection in the prior art. [0005] The embodiment of the present invention disc...
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IPC IPC(8): G06T7/00G06T7/12G06T7/136G06T7/70
CPCG06T7/0004G06T2207/10004G06T2207/20081G06T2207/20084G06T2207/30121G06T7/12G06T7/136G06T7/70
Inventor 王佳松孙海江
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI