A control method, device and storage medium of a three-dimensional memory

A control method and a technology of a control device, which are applied in the field of semiconductors, can solve problems such as the decrease of channel current, and achieve the effect of increasing current and improving channel current

Active Publication Date: 2021-08-17
YANGTZE MEMORY TECH CO LTD
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there are various challenges in 3D memory technology, for example, there is a rapid drop in channel current as the number of layers continues to increase

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A control method, device and storage medium of a three-dimensional memory
  • A control method, device and storage medium of a three-dimensional memory
  • A control method, device and storage medium of a three-dimensional memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the specific technical solutions of the invention will be further described in detail below in conjunction with the drawings in the embodiments of the present invention. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0042] The memory is divided into NOR type memory (English expression is NOR Flash) and NAND type memory (English expression is NAND Flash) according to the internal structure. Among them, each bit line in the NOR type memory (English expression is Bit Line (referred to as BL) Each storage unit tube under each bit line in the NAND memory is connected in series and can realize page (English expression as page) reading. Here, the series structure of the memory cell tubes reduces the occupied area of ​​the metal wires, and the utilization rate of the ch...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Embodiments of the present invention provide a control method, device and storage medium for a three-dimensional memory. Wherein, the method includes: determining to perform a read operation on the selected first word line; the selected first word line is at least one of a plurality of word lines in the three-dimensional memory; Apply a first voltage on the upper; wherein, the first voltage is used to turn on the memory cell transistor on the first word line; the first voltage is higher than the second voltage; the second voltage is determined for the division When other word lines other than the first word line perform read operations, the voltage applied on the other word lines; the second voltage is used to turn on the memory cell transistors on the other word lines. In the embodiment of the present invention, when the read operation is performed on the first word line, the read-on voltage on the first word line selected in the three-dimensional memory is increased to increase the voltage flowing through the memory cell transistor on the first word line. current, thereby increasing the channel current in three-dimensional memory.

Description

technical field [0001] The present invention relates to the technical field of semiconductors, in particular to a control method, device and storage medium of a three-dimensional memory. Background technique [0002] In recent years, the development of flash memory (expressed as Flash Memory in English) is particularly rapid. The main feature of flash memory (referred to as memory in the following description) is that it can keep stored information for a long time without power on, and has the advantages of high integration, fast access speed, easy erasing and rewriting, etc. Therefore, it has been widely used in many fields such as microcomputer and automatic control. Moreover, in order to adapt to the current increasing amount of data storage in various fields, the capacity of the memory is also increasing. [0003] In the related technology, two-dimensional (2D, 2 Dimensions) memory shrinks the storage unit tube (expressed in English as cell, where the storage unit tube...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/08G11C16/10G11C16/26
CPCG11C16/08G11C16/10G11C16/26
Inventor 宋雅丽
Owner YANGTZE MEMORY TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products