Storage unit quality measurement method applied to loss equalization

A storage unit and quality measurement technology, which is applied in the field of storage unit quality measurement, can solve the problems of low accuracy of the storage unit quality measurement method and does not consider the difference in loss degree, etc., and achieve high accuracy, low measurement cost, and high measurement efficiency Effect

Active Publication Date: 2019-12-17
FUTUREPATH TECH
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Problems solved by technology

[0006] Aiming at the defects of the prior art, the purpose of the present invention is to propose a storage unit quality measurement method applied to wear leveling, aiming at solving the storage unit quality measurement caused by the prior art not considering the difference in the degree of wear of storage units in different periods The problem of low accuracy of the method

Method used

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  • Storage unit quality measurement method applied to loss equalization
  • Storage unit quality measurement method applied to loss equalization
  • Storage unit quality measurement method applied to loss equalization

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Embodiment

[0038] Taking the storage block in the flash memory (NAND flash) under a certain manufacturing process, that is, the storage unit, as the measurement object and quality measurement object of this embodiment, the quality measurement method includes:

[0039] S1. According to the measurement capability of the actual storage system, select a plurality of feature values ​​from the storage unit feature set as the storage unit quality measurement feature;

[0040]Specifically, the storage system where the storage block in the flash memory (NAND flash) is located can measure the operating time of the storage unit, the number of programming / erasing cycles and The number of error bits, so the operating time of the storage unit, the number of programming / erasing cycles and the number of error bits that the storage unit has experienced currently are selected as the storage unit quality measurement feature for quality measurement; wherein, the operation time of the storage unit includes th...

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Abstract

The invention discloses a storage unit quality measurement method applied to loss equalization, which comprises the following steps: S1, selecting a plurality of characteristic values from a characteristic set of a storage unit as storage unit quality measurement characteristics according to the measurement capability of an actual storage system; and S2, calculating to obtain a storage unit quality measurement result according to the storage unit quality measurement characteristics and a pre-trained storage unit quality measurement model. According to the invention, the loss degree differenceof the storage unit in different periods is considered; a plurality of measurement characteristics capable of more accurately reflecting the current reliability state of the storage unit, such as operation time and threshold voltage distribution, are adopted; and the accurate storage unit quality measurement model applied to loss equalization is established, so that the accuracy of a quality measurement result can be greatly improved, the loss equalization execution efficiency of the storage system is improved, and the service life of the storage system is prolonged.

Description

technical field [0001] The invention belongs to the field of storage unit quality measurement, and more particularly relates to a storage unit quality measurement method applied to loss leveling. Background technique [0002] With the development of information technology, memory, as the carrier of storing data in electronic equipment, has become more and more important in the fields of communication, consumption, computer, industrial control, military and other fields, but low reliability has always been one of the main problems of memory . [0003] Wear leveling (also known as wear leveling) is a technique for extending the useful life of erasable computer storage media such as solid-state drives (SSDs), USB flash drives, and phase-change memory. In the absence of wear leveling, the underlying flash controller must permanently assign the operating system's logical addresses to the flash's physical addresses. This means that every write to a previously written block must ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/34
CPCG11C16/3495
Inventor 刘政林潘玉茜陈卓文思诚
Owner FUTUREPATH TECH
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