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Differentiated testing system and method based on intelligent decision making

An intelligent decision-making and testing system technology, applied in fault hardware testing methods, neural learning methods, and using startup testing to detect faulty hardware, etc., can solve problems such as shortage of testing systems, lack of testing capabilities, and insufficient human resources.

Pending Publication Date: 2020-02-11
BEIJING INST OF ELECTRONICS SYST ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the lack of intelligent decision-making units, there is no selective and differentiated testing capability for specific electronic products. The shortage of human resources and the shortage of testing systems have become problems that have to be faced.

Method used

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  • Differentiated testing system and method based on intelligent decision making
  • Differentiated testing system and method based on intelligent decision making
  • Differentiated testing system and method based on intelligent decision making

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] The currently widely used test system does not have the ability to obtain state information such as temperature, vibration, and displacement of the electronic product under test during the test process, nor does it have the ability to monitor the connection status of the electronic product under test and the movement state of the movable mechanism during the test process. And identification ability, not to mention the intelligent decision-making of the t...

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Abstract

The invention provides a differentiated test system and method based on intelligent decision making. Compared with an existing test system, the test system is intelligently improved; autonomous learning equipment and intelligent decision-making equipment are arranged; differentiated test requirements can be met; the autonomous learning equipment can be trained according to the existing historicaldata; a stable corresponding relationship between the test result and the control information is obtained. The invention can be used for guiding the next test operation, so that the electronic productcan be automatically tested in a targeted manner, automatic selection and differential test can be performed on the specific electronic product, the test of the whole electronic product can be fullyautomatically operated, and manpower and material resources are saved.

Description

technical field [0001] The invention relates to the field of electronic product testing, and more specifically, to a differentiated testing system and method based on intelligent decision-making. Background technique [0002] The test system is an inspection tool for the quality of electronic products, and can provide regular maintenance for products to ensure stable and reliable work. However, with the increase in test complexity, the traditional traversal test and measurement methods are difficult to meet the needs of productivity. In order to improve test efficiency, To meet the production equivalent requirements, a differentiated test system design based on intelligent decision-making was carried out. [0003] The currently widely used test system is mainly composed of main control computer, test and measurement equipment, energy supply equipment, etc., and the test work is carried out according to fixed procedures and projects. Due to the lack of intelligent decision-m...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06N3/04G06N3/08
CPCG06F11/2273G06N3/08G06F11/2284G06N3/045
Inventor 信朝阳苏东泽乔道鹏
Owner BEIJING INST OF ELECTRONICS SYST ENG