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Ultra-broadband terahertz spectroscopy measurement system and method for plasma covering target

A plasma and spectral measurement technology, applied in the field of terahertz spectrum detection, can solve the problems of small size, the inability of terahertz waves to meet the wide spectrum requirements, restricting the development of terahertz, etc., to achieve the effect of increasing security

Active Publication Date: 2021-11-02
TIANJIN UNIV
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Problems solved by technology

[0003] However, there are few reports on the research on plasma in terahertz detection, and the current method of generating terahertz waves still cannot meet the wide spectrum requirements required for applications, which has become the main factor restricting the development of terahertz
In addition, during the research process, it was also found that the size of the plasma generated by the laser is too small compared to the size of the terahertz spot, which makes it difficult to block the target object detected by the terahertz wave

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  • Ultra-broadband terahertz spectroscopy measurement system and method for plasma covering target
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  • Ultra-broadband terahertz spectroscopy measurement system and method for plasma covering target

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[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0026] The invention relates to an ultra-broadband terahertz spectrum measurement system for non-uniform plasma covering targets in a laboratory environment, which is used for ultra-broadband terahertz spectrum detection of non-uniform plasma and covering targets. Especially the design of ultra-broadband terahertz radiation source, using the method of nonlinear frequency conversion difference frequency to generate terahertz wave radiation based on organic crystals has the advantages of working at room temperature, narrow linewidth, no threshold limit, wide tuning range, etc., and has ultra-broadband The tuning frequency range reaches 0-20THz, and the gas jet non-uniform plasma is obtained by using the dielectric barrier di...

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Abstract

An ultra-broadband terahertz spectrum measurement system and method for plasma covering a target, the system includes a double crystal optical parametric oscillator, a difference frequency unit based on DAST crystal, a plasma generation unit and a detection unit, wherein a beam of laser light is incident on The dual-crystal optical parametric oscillator, through optical parametric oscillation, outputs two idler frequencies with similar frequencies and can be adjusted as the dual wavelengths required for the difference frequency, and outputs ultra-wideband terahertz in the DAST crystal of the difference frequency unit The terahertz wave penetrates the plasma generated by the plasma generating unit and enters the detector. The present invention greatly expands the measurable frequency range (0-20THz) of current terahertz research by adopting the non-linear frequency conversion difference frequency method based on organic crystals, and can study the influence of plasma on terahertz waves in an ultra-wide tuning range.

Description

technical field [0001] The invention relates to the technical field of terahertz spectrum detection, in particular to an ultra-broadband terahertz spectrum measurement system and method in which plasma covers a target. Background technique [0002] Terahertz (THz) waves have the characteristics of universality, transientness, low energy, and broadband, and can be widely used in spectroscopy, biological detection, quality control, satellite communication, and other fields. In some terahertz detection environments, there will be a plasma layer, which will affect the detection process. Therefore, the research on the influence of plasma in the transmission process of terahertz waves is of great significance. [0003] However, there are few reports on plasma-related research in terahertz detection, and the current methods of generating terahertz waves still cannot meet the wide spectrum requirements required for applications, which has become the main factor restricting the devel...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V8/10G01J3/28G01J3/10G01J3/02
CPCG01J3/0208G01J3/10G01J3/28G01V8/10
Inventor 李吉宁耿兴宁徐德刚范小礼刘畅钟凯王与烨姚建铨
Owner TIANJIN UNIV