Method and device for screening substrate material in low-emissivity glass

A low-emissivity glass and substrate material technology, applied in computer material science, instrumentation, computational theoretical chemistry, etc., can solve the problems of long cycle, low efficiency, waste of manpower, material resources and financial resources for substrate material screening, and achieve saving Effects of test costs, cost avoidance, and shortened screening cycle

Active Publication Date: 2020-02-25
CHINA BUILDING MATERIALS ACAD
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Problems solved by technology

[0002] The "substrate-silver film" interface technology is applied in low-emissivity glass, but what kind of material to choose as the substrate can make the silver film have good adhesion strength and crystallization order on the substrate. There is no effective method for prediction and evaluation. In the laboratory, various material

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  • Method and device for screening substrate material in low-emissivity glass
  • Method and device for screening substrate material in low-emissivity glass
  • Method and device for screening substrate material in low-emissivity glass

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Embodiment Construction

[0050]In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the method and device for screening substrate materials in a low-emissivity glass proposed according to the present invention will be described below in conjunction with the accompanying drawings and preferred embodiments. Its specific implementation, structure, feature and effect thereof are described in detail as follows.

[0051] The invention proposes a method for screening substrate materials in low-emissivity glass, as shown in the attached figure 1 As shown, it includes the following steps:

[0052] Obtaining the parameters of the optimal adsorption configuration of the silver film on the candidate substrate material, the first reference substrate material and the second reference substrate material under different coverages respectively;

[0053] Predicting the adhesion strength of the silver film on the candidate substrate mater...

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Abstract

The invention mainly aims to provide a method and a device for screening a substrate material in low-emissivity glass. The method comprises the following steps: respectively acquiring parameters of optimal adsorption configurations of a silver film on a candidate substrate material, a first reference substrate material and a second reference substrate material under different coverage degrees; predicting the adhesion strength of the silver film on the candidate substrate material and predicting the crystallization orderliness of the silver film on the candidate substrate material; and screening a material with good adhesion strength and good crystallization orderliness to be used as a substrate material forming an interface with the silver film in the low-emissivity glass. The objective ofthe invention is to solve the problem that by use a computer simulation technology, the adhesion strength and the crystallization orderliness of the silver film on the substrate material can be evaluated and predicted without actually manufacturing a film layer entity, the novel substrate material is predicted and screened, the research and development efficiency is expected to be improved, the test cost is greatly reduced, and the device becomes an effective auxiliary tool for research and development of a film coating, so that the method and the device are more practical and more suitable for practical application.

Description

technical field [0001] The invention belongs to the technical field of interface materials, and in particular relates to a method and device for screening substrate materials in low-emissivity glass. Background technique [0002] The "substrate-silver film" interface technology is applied in low-emissivity glass, but what kind of material to choose as the substrate can make the silver film have good adhesion strength and crystallization order on the substrate. There is no effective method for prediction and evaluation. In the laboratory, various materials can only be used as substrates continuously, and the adhesion strength and crystallization order of the silver film layer on the substrate material can be detected afterwards. This method has a long cycle for screening substrate materials, has very low efficiency, and will waste a lot of manpower, material resources and financial resources. [0003] Quantum mechanics is one of the most important scientific discoveries of t...

Claims

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Application Information

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IPC IPC(8): G16C60/00G16C10/00G16C20/30
CPCG16C60/00G16C10/00G16C20/30
Inventor 孙文明张艳鹏余刚
Owner CHINA BUILDING MATERIALS ACAD
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