Unlock instant, AI-driven research and patent intelligence for your innovation.

Error code tester and test system suitable for various types of optical modules

A technology of bit error testing and testing system, applied in transmission systems, electromagnetic wave transmission systems, electrical components, etc., can solve the problems of high cost, single type of interface, low efficiency, etc., and achieve the effect of improving test efficiency and saving costs

Active Publication Date: 2020-02-28
CHINA ELECTRONIS TECH INSTR CO LTD
View PDF27 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the types of BER tester interfaces for testing optical modules are single, and generally only support 1-2 types of optical modules.
It cannot meet the test requirements of various types of optical modules. If you want to test various optical modules, you need multiple BER testers that support different types of optical modules. When testing optical modules in batches, you need to operate multiple BER testers, and the cost high and low efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Error code tester and test system suitable for various types of optical modules
  • Error code tester and test system suitable for various types of optical modules
  • Error code tester and test system suitable for various types of optical modules

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] This embodiment discloses a bit error tester that can adapt to multiple types of optical modules, including one or more single board systems, and each single board system includes: a function board unit, an interface board unit, an adapter board unit; a function board The unit includes a CPU module and an FPGA module, and the host computer configures FPGA files and control commands through the CPU module; the interface board unit includes ten interface boards adapted to different types of optical modules, which can be paired with function boards according to requirements. Wherein, each interface board corresponds to a unique identification code; the adapter board unit realizes the function of connecting the single-board system and the backplane.

[0036] In this embodiment, the unique identification code is determined by an identification circuit, the identification circuit includes a plurality of first resistors, one end of the plurality of resistors is connected to a p...

Embodiment 2

[0046] A code error testing system adaptable to multiple types of optical modules, comprising the above-mentioned one or more code error testers and a host computer.

[0047] The upper computer can also be connected with the client, and when the configuration file in the upper computer needs to be modified, configuration is performed through the client.

[0048] First of all, after the system is powered on, it performs system initialization and self-inspection. After the self-inspection is successful, the host computer starts the server monitoring thread.

[0049] The upper computer stores identification information of multiple types of optical module interfaces, and the server monitors a thread, and the monitor thread performs the following operations when starting:

[0050] (1) Monitoring the insertion and removal of optical modules

[0051] When it is detected that an optical module is inserted, the program transfers to the optical module detection and recording thread: ac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an error code tester suitable for various types of optical modules and a test system, the error code tester comprises one or more single-board systems, each single-board systemcomprises an FPGA module, a CPU module connected with the FPGA module, and a plurality of interface boards used for inserting the optical modules; wherein the plurality of interface boards can adaptto different types of optical modules, and each interface board corresponds to a unique identification code; wherein the FPGA module is connected with an upper computer through the CPU module, when anoptical module is inserted, the interface board sends a corresponding identification code to the upper computer through the FPGA module, and the upper computer identifies the type of the inserted optical module based on the identification code and sends a corresponding configuration file to the FPGA module; and the FPGA module performs an error code test according to the configuration file. The method can be suitable for detecting the error codes of various types of optical modules, and the inserted optical modules are adaptively tested according to the configuration information of the types.

Description

technical field [0001] The invention belongs to the technical field of bit error testing, and in particular relates to a bit error tester and a testing system suitable for various types of optical modules. Background technique [0002] The statements in this section merely provide background information related to the present disclosure and do not necessarily constitute prior art. [0003] With the large-scale application of big data, cloud computing and the Internet of Things, the data traffic is increasing rapidly, and the requirements for network transmission are getting higher and higher. Optical fiber transmission has the characteristics of large transmission bandwidth, low transmission loss, and strong anti-interference ability. It plays a dominant role in high-speed network transmission. The corresponding optical modules are more and more widely used, and there are more and more testing requirements for optical modules. [0004] At present, the types of BER tester in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/079
CPCH04B10/07953
Inventor 张磊胡亚平
Owner CHINA ELECTRONIS TECH INSTR CO LTD