Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wide-range searchable scanning probe microscope

A technology of probe microscope and search scanning, which is applied in the field of scanning probe microscope, can solve the problems such as the limited scanning range of scanning probe microscope, and achieve the effect of improving precise scanning effect, improving scanning accuracy and reasonable structure

Inactive Publication Date: 2020-03-06
NANJING UNIV OF INFORMATION SCI & TECH
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention solves the problem that the scanning range of the current scanning probe microscope is limited

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wide-range searchable scanning probe microscope
  • Wide-range searchable scanning probe microscope
  • Wide-range searchable scanning probe microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.

[0019] see Figure 1-Figure 3 , the present invention provides a technical solution: a large-scale searchable scanning probe microscope, including a large scanning tube 1, a small scanning tube 2, a precise scanning mechanism 3, a bottom plate 4 and a probe 5, and the bottom of the large scanning tube 1 is installed There is a small scanning tube 2, the bottom of the small scanning tube 2 is equipped with a bottom plate 4, the upper end of the small scanning tube 2 is equipped with a probe 5, and the left side of the large scanning tube 1 is equipped with a precision scanning mechanism 3.

[0020] The precise scanning mechanism 3 includes a vertical rod 31, a positioning block 32, a linear motor 33, a fastening nut 34, a fastening nail 35, a cross...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a large-range searchable scanning probe microscope. The microscope comprises a vertical rod, a positioning block, a linear motor, a fastening nut, a fastening nail, a cross rod,an inertia motor, a bracket and a sample groove; the vertical rod is assembled on the upper end face of the bottom plate; the fastening nut is assembled at the lower side of the annular side surfaceof the vertical rod; the linear motor is assembled on the annular side surface of the vertical rod; the bracket is assembled on the right side of the linear motor; the positioning block is assembled on the upper side of the annular side surface of the vertical rod; the right end surface of the positioning block is connected with the cross rod, the lower end surface of the cross rod is provided with the inertia motor, the upper end surface of the inertia motor is provided with the fastening nail, and the lower end surface of the inertia motor is provided with the sample groove. The design solves the problem of limited scanning range of an existing scanning probe microscope, the structure is reasonable, and the scanning precision of the scanning probe microscope is conveniently improved.

Description

technical field [0001] The invention is a large-scale searchable scanning probe microscope, which belongs to the technical field of scanning probe microscope technology. Background technique [0002] Scanning probe microscopy has a wide range of applications due to its extremely high resolution, observation of real surface topography, and relaxed use environment. The core principle of scanning probe microscopy is to characterize the sample through the tunneling current (scanning tunneling microscope) or atomic force (atomic force microscope) or magnetic interaction (magnetic force microscope) between the probe and the sample. Therefore, the piezoelectric scanning tube is required to drive the probe to perform two-dimensional scanning, so the scanning range of the scanning probe microscope is determined by the scanning head. If you want to scan in a large area, the usual way is to increase the aspect ratio of the scanning tube, or increase the control voltage of the scanning...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01Q10/00
CPCG01Q10/00
Inventor 郭颖夏德铸王晨顾启伟徐翰英陈浩
Owner NANJING UNIV OF INFORMATION SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com