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Forward compatibility-based folding set hierarchical compression method and device
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A compression method and compatibility technology, applied in the field of data coding, can solve the problems of incompatible data blocks and reduce the compression rate, and achieve the effect of improving the compression rate and high efficiency
Active Publication Date: 2020-03-06
HEFEI WISDOM DRAGON MACHINERY DESIGN CO LTD
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[0008] The technical problem to be solved by the present invention is to provide a forward-compatible fold set hierarchical compression method to solve the problem that the data blocks divided by the test vectors in the above-mentioned background technology often have no compatibility relationship, thereby reducing the compression rate.
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Embodiment 1
[0088] In an embodiment of the present invention, a forward-compatible-based folding set hierarchical compression method, the steps are as follows:
[0089] S1. Divide test vectors,
[0090] Divide the test vectors in the test set into data blocks of equal length k bits in sequence, and if the last data block is less than k bits, fill it with irrelevant bits;
[0091] Among them, k refers to a positive integer; in the test set, the test vector includes several data blocks, which are Z1, Z2...Zn in sequence, where n is any positive integer.
[0092] Each data block is a set of 0, 1, x, where x is a don't care bit.
[0093] S2. Obtain the folding set, and obtain the data block to be encoded,
[0094] Obtain the first data block in the test vector as the current data block Z1, and the remaining Z2...Zn are data blocks to be encoded, and the current data block Z1 is recorded as the first reference data block r, and the reference data block r is stored in Register RAM1, register R...
Embodiment 2
[0139] A compression device employing a forward-compatible fold-set-based hierarchical compression method, comprising;
[0140] Divide module 301, be used for dividing test vector;
[0141] The division module 301 also includes dividing the test vectors in the test set into data blocks of equal length k bits in order, and if the last block of data blocks is less than k bits, fill and complete with irrelevant bits;
[0142] Among them, k refers to a positive integer; in the test set, the test vector includes several data blocks, which are Z1, Z2...Zn in turn, where n is any positive integer;
[0143] Each data block is a set of 0, 1, x, where x is a don't care bit.
[0144] An acquisition module 302, configured to acquire a data block to be encoded and a folding set from the divided test vectors;
[0145] The acquiring module 302 also includes acquiring the first data block Z1 in the test vector, and the remaining Z2...Zn are data blocks to be encoded, the first data block Z1...
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Abstract
The invention relates to a forward compatibility-based folding set hierarchical compression method. The method comprises the following steps of: S1, dividing test vectors; S2, obtaining to-be-coded data blocks and a folding set from the divided test vectors; S3, sequentially encoding the to-be-coded data blocks according to the folding set; and S4, judging whether the to-be-coded data blocks are the last one, if so, outputting the compressed test vector, and if not, returning to execute the step S3. The invention further discloses a forward compatibility-based folding set hierarchical compression device. According to the invention, the test vectors are divided to generate the folding set by using a reference vector as a folding seed, and the compatibility of the remaining to-be-coded datablocks and the reference vector is judged in sequence, so that the compatibility condition of the reference vector is reduced, the two data blocks which do not have the original compatibility relationship generate the compatibility relationship, the compatibility between the data blocks is improved, and the data compression rate is further improved on the basis of original compatibility compression.
Description
technical field [0001] The present invention relates to data encoding technology, and more specifically to a forward-compatible fold-set layered compression method and device. Background technique [0002] VLSI ((Very Large Scale Integration, Very Large Scale Integration) The feature size of transistors on a chip decreases at a rate of about 10.5% per year, resulting in an increase in transistor density at a rate of about 22.1% per year. With the increase of transistor density, the required The number of test vectors also increases. A large amount of test data not only exceeds the capacity of the automatic test equipment memory and I / O channels, but also prolongs the test time and affects the test cost. Test data compression, change the scan chain structure, use logic Built-in self-test is three methods that can reduce the test time, but for the existing IP core, it is impossible to change the scan chain structure, and the use of logic built-in self-test needs to redesign th...
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