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Calibration method of Laue diffraction pattern

A calibration method, Laue's technology, applied in the field of X-ray diffraction, to achieve the effect of fast calibration and time-consuming reduction

Active Publication Date: 2020-03-27
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

With the development of experimental devices, the time-consuming calibration process has gradually become one of the factors limiting the development of this technology

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  • Calibration method of Laue diffraction pattern
  • Calibration method of Laue diffraction pattern
  • Calibration method of Laue diffraction pattern

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Embodiment Construction

[0033] The following will refer to the attached Figure 1 to Figure 2 Specific examples of the present invention are described in more detail. Although specific embodiments of the invention are shown in the drawings, it should be understood that the invention may be embodied in various forms and is not limited to the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present invention and to fully convey the scope of the present invention to those skilled in the art.

[0034] It should be noted that certain terms are used in the specification and claims to refer to specific components. Those skilled in the art should understand that they may use different terms to refer to the same component. The specification and claims do not use differences in nouns as a way of distinguishing components, but use differences in functions of components as a criterion for distinguishing. "Includes" or "comprises" mentioned throughout ...

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Abstract

The invention discloses a calibration method of a Laue diffraction pattern. The method comprises the following steps: solving the miller indexes of all Laue diffraction peaks of the sample in the energy range of the white-light X-ray light source; obtaining diffraction peaks and positions thereof in the Laue diffraction pattern, marking the obtained diffraction peaks as experimental diffraction peaks, calculating diffraction vectors of the experimental diffraction peaks based on a detector coordinate system, and calculating the direction of a crystal band axis Zi' with the number of the experimental diffraction peaks larger than a preset parameter np; calibrating a crystal band axis Zi' to obtain a Miller index of the crystal band axis, and calculating an orientation transformation matrixT; and comparing the calibrated experimental diffraction peaks, detecting the correctness of the calibration result of the calibrated experimental diffraction peaks through the angle difference between the diffraction peaks, and if the number of the correctly calibrated experimental diffraction peaks is greater than or equal to a predetermined parameter n1, completing the calibration process.

Description

technical field [0001] The invention belongs to the technical field of X-ray diffraction, in particular to a method for calibrating Laue diffraction patterns. Background technique [0002] Laue diffraction using white light X-ray light source is a relatively common characterization method for crystal materials. Through the calibration and analysis of the obtained Laue diagram, various information including crystal composition, phase, orientation and stress and strain can be obtained. And due to the characteristics of Laue diffraction, it does not need to change the geometric relationship between the sample, X-ray source and X-ray detector during the experiment, thus realizing the rapid characterization of the sample. At the same time, with the help of the development of laboratory white light X-ray light sources and white light X-ray light sources based on synchrotron radiation devices, Laue diffraction is more and more widely used in the research and characterization of cry...

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Application Information

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IPC IPC(8): G01N23/2055
CPCG01N23/2055
Inventor 陈凯寇嘉伟
Owner XI AN JIAOTONG UNIV