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Device and method for detecting light leakage of metal signal line

A technology of signal lines and measurement methods, applied in nonlinear optics, optics, instruments, etc., can solve problems such as long time periods, save time and cost, and improve effects

Pending Publication Date: 2020-04-10
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present application provides a method that can solve the problems of the long time period of the metal light leakage detection experiment verification process in the prior art LCD liquid crystal panel, etc.

Method used

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  • Device and method for detecting light leakage of metal signal line
  • Device and method for detecting light leakage of metal signal line
  • Device and method for detecting light leakage of metal signal line

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the application; the terms used herein in the description of the application are only for the purpose of describing specific embodiments , is not intended to limit the present application; the terms "comprising" and "having" and any variations thereof in the description and claims of...

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Abstract

The invention discloses a device for detecting light leakage of a metal signal line, and the device comprises: a backlight source which is used for emitting light; a light blocking sheet which is arranged on an emergent light path of the backlight source and used for blocking part of light emitted by the backlight source; a polaroid assembly which is arranged on an emergent light path of the backlight source, is positioned behind the light barrier, is used for changing the polarization state of light emitted from the light barrier, and comprises a first polaroid and a second polaroid, whereina metal diaphragm sample comprising a metal signal line is placed between the first polaroid and the second polaroid; and a photoreceptor which is arranged behind the polarization assembly and is usedfor detecting the intensity of the light emitted from the polarization assembly. By means of the mode, the improvement effect of the process improvement condition on metal signal line light leakage can be rapidly and quantitatively evaluated, and the time cost is greatly saved.

Description

technical field [0001] The present application relates to the technical field of panel detection, in particular to a device and method for detecting light leakage of metal signal lines. Background technique [0002] Thin-Film Transistor Liquid-Crystal Display (TFT-LCD) has the characteristics of small size, low power consumption, relatively low manufacturing cost and no radiation. It occupies a dominant position in the current flat panel display market and is widely used in Various electronic devices such as mobile phones, televisions, personal digital assistants, digital cameras, laptops, desktop computers, etc. In the LCD liquid crystal panel, the backlight becomes linearly polarized light through the lower polarizer, and when it passes the edge of the metal line (gate line), due to the depolarization effect of the metal, the linearly polarized light will become elliptically polarized light, and at this time there will be light that can pass through the upper Polarizer, s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 刘煌正郭力
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD