A half-sine current pulse reliability test device for terahertz transit time devices
A technology of transit time and current pulse, applied in the field of half-sine current pulse reliability test device of terahertz transit time device
Active Publication Date: 2020-09-29
WENZHOU UNIV
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[0004] To sum up, because the structure and principle of terahertz transit time devices are essentially different from those of traditional diodes, triodes, field effect transistors, laser diodes, photodetectors, etc., none of the devices involves terahertz transit time devices. Reliability Test of Half-sinusoidal Current Pulse of Timing Device
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[0060] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0061] like figure 1 As shown, in the embodiment of the present invention, a half-sine current pulse reliability test device for a terahertz transit time device is provided, which is used on a terahertz transit time device (DUT) to be tested, including a main controller 1, A sinusoidal voltage signal generating circuit 2, a half-sine heating current pulse forming circuit 3, and an energy storage and discharge circuit 4; wherein,
[0062] One end of the sinusoidal voltage signal generating circuit 2 is connected to the first end a1 of the main controller 1, and the other end is connected to one end of the half-sine heating current pulse forming circuit 3 for receiving the pulse signal issued by the main controller 1, and After the pulse signal is converted into a ...
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The invention provides a half-sine current pulse reliability test device for a terahertz transit time device, which includes a main controller, a sinusoidal voltage signal generating circuit, a half-sine heating current pulse forming circuit, and an energy storage and discharge circuit. The sinusoidal voltage signal generation circuit converts the pulse signal into a full-wave sinusoidal voltage signal; the half-sine heating current pulse forming circuit converts the full-wave sinusoidal voltage signal into a half-sine heating current pulse and loads it on the anode of the terahertz transit time device, storing and discharging The energy circuit generates a half-sinusoidal discharge current pulse and loads it on the anode of the terahertz transit time device to carry out a reliability test; the main controller sends out signals and control instructions, and passes through the terahertz transition time according to the half-sine heating current pulse and the half-sine discharge current pulse. The reliability status is determined by the parameters of the device over time. By implementing the invention, a convenient, accurate and intuitive half-sine current pulse reliability test can be carried out on the terahertz transit time device, and the used test parameters and reliability indicators can be displayed.
Description
technical field [0001] The invention relates to the technical field of electronic components, in particular to a half-sine current pulse reliability test device for terahertz transit time devices. Background technique [0002] In the field of electronic technology reliability, the reliability of electronic devices is the basis for the reliability of electronic equipment, electronic systems and other products. Developing a reliability test device according to relevant technical specifications or technical conditions is a necessary technical means for testing the quality and reliability of electronic devices. In order to ensure that the designed terahertz transit time device can meet the specified reliability index and predict the reliability of the device, it is necessary to carry out systematic reliability tests including half-sine current pulse reliability tests to obtain relevant data. The reliability of the device or the electronic system using the device is predicted, a...
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IPC IPC(8): G01R31/26
CPCG01R31/2637G01R31/2642
Inventor 韦文生
Owner WENZHOU UNIV