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Sampling inspection device and method for flaws of plate glass

A flat glass and detection device technology, applied in measurement devices, material analysis by optical means, instruments, etc., can solve the problems of environmental pollution, manual operation pollution, difficulty in manual handling, low sampling efficiency, etc., to reduce manual operation pollution, Improve the sampling rate and accuracy, and reduce the effect of scratches

Pending Publication Date: 2020-04-28
IRICO DISPLAY DEVICES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This traditional method has low sampling efficiency and accuracy, and is easily affected by factors such as environmental pollution and manual operation pollution. Especially for ultra-large flat glass, such as the size of 8.5-generation flat glass with a size of 2200mm×2500mm, manual handling is difficult and cannot be operated.

Method used

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  • Sampling inspection device and method for flaws of plate glass
  • Sampling inspection device and method for flaws of plate glass
  • Sampling inspection device and method for flaws of plate glass

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Embodiment Construction

[0048] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0049] The invention relates to a sampling inspection device for flat glass defects, which includes a main frame 6, an optical detection device and a flat glass detection device arranged on the main frame 6. Such as figure 1 Shown is the front view of the structure of the sampling device for flat glass defects. One side of the main frame 6 is provided with a rolling shutter door 1, and the working frame detection area and the optical detection area are sequentially set in the main frame 6 from the glass entrance; the optical detection device is located in the optical detection area, and the optical detection device includes an optical system 5 and a sliding platform; 5 is fixed on the slider of the sliding platform. The flat glass detection device includes a working frame 12, a workbench 2, a...

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Abstract

The invention provides a sampling inspection device and method for the flaws of plate glass. The structure is simple, operation is convenient, glass is automatically carried, the flaws of the glass are semi-automatically confirmed through an optical system, and the working efficiency and accuracy of sampling inspection of the flaws of the glass are improved. The sampling inspection device for theflaws of plate glass comprises a main rack, and an optical detection device and a plate glass detection device which are arranged on the main rack. A working rack detection area and an optical detection area are sequentially arranged in the main rack from the glass inlet end. The optical detection device is located in the optical detection area and comprises an optical system and a sliding platform. The optical system is fixed on a sliding block of the sliding platform. The plate glass detection device is located in the working rack detection area and comprises a workbench, a rotary driving servo motor, a supporting sliding block, a rotary support, a lifting movement driving servo motor and a working rack. Parallel rails are vertically arranged on the two sides of the working rack respectively.

Description

technical field [0001] The present invention relates to the technical field of random inspection of flat glass defects, in particular to a device and method for sampling defects of flat glass, and more specifically to a device for visually or optically inspecting and sampling the defects of flat glass plates. Background technique [0002] The flat glass grade sampling inspection device is mainly used for off-line random inspection and analysis of defects. The traditional flat glass quality sampling device removes the glass from the transmission line by hand and places it on the workbench. According to the coordinates of defects or particles detected by the online equipment, use a tape measure to delineate the φ10mm area, and hold a bright flashlight to visually look for defects or particles. Confirm Afterwards, calibrate with a marker pen, cut glass samples and observe and analyze them with an optical system. This traditional method has low sampling efficiency and low accur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958G01N21/01
CPCG01N21/958G01N21/01
Inventor 李淼焦宗平王答成
Owner IRICO DISPLAY DEVICES
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